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  1.   NT-MDT at Fall MRS 2014 It’s All Action With Your AFM & Raman Company!
    NT-MDT Nov 27, 2014

    Sponsoring Key MRS Symposium on Advances in Scanning Probe Microscopy for Multimodal Imaging at the Nanoscale MRS 2014 December 1st-December 4th Symposium PP.

  2.   Professional AFM Images with a Three Step Click SmartScan by Park Systems
    Park Systems Nov 25, 2014

    Revolutionizes Atomic Force Microscopy by Automatizing the Imaging Process

  3.   Park NX-Wafer fully automates the automatic defect review process for bare wafer
    Park Systems Jul 15, 2014

    A revolutionary AFM design for bare wafer manufacturing that fully automates the automatic defect review process and increases production throughput by an astounding 1,000%.

  4. PTR Nanoscale Measurements that Increase Production Yields by 200 Percent
    Park Systems May 29, 2014

    Park Systems Collaborates with Leading Hard Disc Drive Manufacturers to Develop PTR Nanoscale Measurements that Increase Production Yields by 200 Percent.

  5. Quorum Technologies wins Queen’s Award for Enterprise
    Quorum Technologies Apr 22, 2014

    Quorum Technologies is proud to receive the Queen’s Award for International Trade.

  6.   Lake Shore showcasing cryogenic probe stations at MRS Spring
    Lake Shore Cryotronics, Inc. Apr 15, 2014

    Lake Shore showcasing cryogenic probe stations, including entry-level TTPX, at MRS Spring.

  7. Park Systems Introduces Automatic Defect Review for Semiconductor Wafers
    Park Systems Apr 3, 2014

    An Astounding 1,000% Throughput Increase

  8.   Dimension FastScanTM Atomic Force Microscope
    Bruker Nano Surfaces Mar 6, 2014

    The Dimension FastScanTM Atomic Force Microscope (AFM) delivers, for the first time, extreme imaging speed without sacrificing legendary Dimension© Icon© resolution and performance.

  9.   Park Systems 2014 Announces Atomic Force Microscopy Image Contest Winner
    Park Systems Mar 5, 2014

    Park Systems, a leader in Atomic Force Microscopy (AFM) since 1997 announces their first AFM image contest winner, Namuna Panday, a Graduate Student at Florida International University.

  10.   Park Systems New Atomic Force Microscope Technology Surpasses Old Standards
    Park Systems Mar 5, 2014

    Park Systems New Atomic Force Microscope Technology Surpasses Old Standards for Semiconductor Failure Analysis Detection Ensuring Accuracy and Lowering Costs.