The Dimension FastScanTM Atomic Force Microscope (AFM) delivers, for the first time, extreme imaging speed without sacrificing legendary Dimension© Icon© resolution and performance.
Park Systems, a leader in Atomic Force Microscopy (AFM) since 1997 announces their first AFM image contest winner, Namuna Panday, a Graduate Student at Florida International University.
Park Systems New Atomic Force Microscope Technology Surpasses Old Standards
Park Systems Mar 5, 2014
Park Systems New Atomic Force Microscope Technology Surpasses Old Standards for Semiconductor Failure Analysis Detection Ensuring Accuracy and Lowering Costs.
Columbus, Ohio (January 23, 2014)- Lake Shore slated to receive Phase II Air Force grant for terahertz system development.
Nanosurf AG Jan 15, 2014
An all-in-one AFM for nano education and small samples.
Park Systems Unveils New Park XE15
Park Systems Jan 6, 2014
Powerfully Versatile Atomic Force Microscope with Unique MultiSample™ Scan.
Park Systems Introduces QuickStep SCM
Park Systems Dec 2, 2013
New High Speed Scanning Capacitance Microscopy
Fluid Force Microscopy (FluidFM) combines the unique possibilities of nanofluidics with the positional accuracy and force sensitivity of the atomic force microscope...
Park Systems Introduces Park NX-HDM
Park Systems Jul 4, 2013
Fully Automated Automatic Defect Review and Sub-Angstrom Surface Roughness for Hard Disk Media and Semiconductor Substrates.
Nanosurf AG Jun 10, 2013
A unique new tool for single cell biology and beyond
Nanosurf AG Jun 10, 2013
Your Versatile Research AFM for Materials & Life Science
Quorum Technologies has moved
Quorum Technologies Aug 14, 2013
Quorum Technologies has recently relocated to a new, purpose-built factory and offices in the village of Laughton in East Sussex...
Lake Shore Receives Air Force STTR Phase 1 Award to Advance Terahertz Materials
Lake Shore Cryotronics, Inc. Apr 15, 2013
Lake Shore announced today that the company has been selected by the US Air Force to receive a Phase 1 STTR grant for a project called “Terahertz Frequency Materials Testing at Cryogenic...
A high stability diode OEM laser with diffraction limited performance for more demanding applications is now offered by Elliot Scientific. Wavelengths available are within the range 375 to 1550 nm.
508 PV™ adds UV-VIS-NIR spectrophotometry and imaging to legacy microscopes
Elliot Scientific Ltd. Oct 4, 2013
Elliot Scientific is now offering the new 508 PV™ UV-visible-NIR spectrophotometer to microscopists and physicists in the UK and Ireland.
NPXY50-286 Nanopositioning Piezo Stage
nPoint Inc. Aug 22, 2013
The NPXY50-286 is the latest addition to nPoint’s piezo stage lineup. The stage is designed for high specification research and OEM markets where small size, fast speed, and high resolution are ideal.
WITec’s RayShield Coupler makes accessible Raman data at low wavenumbers
LOT-QuantumDesign Ltd Aug 15, 2013
WITec’s RayShield Coupler is now available for the alpha300 and alpha500 microscope series. It allows the acquisition of Raman spectra at wavenumbers down to below 10 rel. cm-1.
PZ 300 AP - z-axis elevator stage
piezosystem jena GmbH Jun 20, 2013
The PZ 300 AP of piezosystem jena is developed for microscopy techniques and can be used as accessories for microscopes. It provides an accurate and a very quick scanning of a probe on the z-axis.
The new MIPOS 16-158 is specifically designed for high precision positioning of optical systems with an accuracy in the sub-nanometer range. The MIPOS offer new possibilities for optical setups.
Motorized Rotary Stage with High Precision with Air Bearing and Vacuum Option
PI (Physik Instrumente) Piezo Nano Positioning Jun 10, 2013
A variety of high resolution rotation positioners for instrumentation and automation is offered by PI miCos.