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Metrology

Buyer's guide > Tools, analysis and lab supplies > Metrology

Showing product 1 to 20 of 597 in Metrology.
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  1.   ESPion Langmuir probe for plasma process characterisation
    Hiden Analytical Limited Apr 14, 2016

    The Hiden ESPion Langmuir-style electrostatic plasma probes, now for operation in both RF and DC plasma, automatically report the critical characteristics of electron density...

  2.   New Terahertz Material Characterization System Installed in Brown University Lab
    Lake Shore Cryotronics, Inc. Apr 7, 2016

    Unique CW-THz spectroscopy system to aid Mittleman Lab in materials research

  3.   Material measurement, characterization platforms focus of Lake Shore MRS Spring
    Lake Shore Cryotronics, Inc. Mar 24, 2016

    Visit Booth 112 to see cryogenic probe station and THz probe arm option demonstrations.

  4.   Lake Shore exhibiting THz probing and new sensor monitoring products at APS
    Lake Shore Cryotronics, Inc. Mar 10, 2016

    Visit Booth 701 to see demonstrations and discuss material and cryogenic measurement solutions.

  5. Lake Shore Model 372 firmware for enhanced low temperature measurements
    Lake Shore Cryotronics, Inc. Mar 4, 2016

    More frequencies, sensor calibration curve interpolation added to AC resistance bridge/controller.

  6. Versatile AC resistance bridge for precise, ultra-low temperature control
    Lake Shore Cryotronics, Inc. Mar 4, 2016

    The Lake Shore Model 372 AC resistance bridge and temperature controller makes it easy to perform multiple tasks...

  7.   Mass Spectrometer for Bioreactor Quantification
    Hiden Analytical Limited Jan 7, 2016

    The Hiden HPR-40 DSA mass spectrometer systems are engineered specifically for monitoring dissolved gaseous content in aqueous solutions.

  8.   Virtual NanoLab (VNL)
    QuantumWise A/S Oct 14, 2015

    Virtual NanoLab works as a graphical user interface (GUI) for Atomistix ToolKit (ATK) and as a flexible GUI for other software packages.

  9. Park Systems Expansion in AFM Market Includes Appointment of New Executives
    Park Systems Apr 21, 2016

    Park Systems, world-leader in atomic force microscopy (AFM) announced today the appointments of Charlie Park as Senior Vice President of Global Sales, and Jong-Pil Park as Vice President of Production

  10. Revolutionary Park System SmartScan Automatizes the AFM Imaging Process
    Park Systems Apr 13, 2016

    High Quality Images at Click of a Button

  11. Nanopositioner, Industry - no extension of the optical axis - MIPOS 140 OEM
    Piezosystem Jena GmbH Jan 12, 2016

    The MIPOS 140 microscope-positioner from piezosystem jena can be screwed on microscopes in industry applications. The optical axis stays the same and isn't extended.

  12. Industrial Nanopositioner with ultra parallel surface - MIPOS 250 SG
    Piezosystem Jena GmbH Jan 12, 2016

    The MIPOS 250 SG from piezosystem jena guarantees best integration in industrial application through it ultra parallel surface.

  13. Hitachi EA8000, Raw Material Particle Contamination Analyzer
    Eastern Applied XRF Standards Laboratory Jan 12, 2016

    Eastern Applied offers this combination of transmission x-ray and x-ray fluorescence for particle contamination analysis of raw materials used in Lithium Ion battery quality control.

  14. Hitachi XRF, FT150 for Ultra Thin Film Measurements
    Eastern Applied XRF Standards Laboratory Jan 12, 2016

    Designed with poly-capillary optics, the Hitachi FT-150 provides high precision for the thinnest thickness applications. Specializing in semiconductor wafer fab quality control but offering much more

  15. Specialized system – Piezo Micrometer Screw Drive MICI
    Piezosystem Jena GmbH May 29, 2015

    These elements were originally developed for quality control applications in the optics industry. They consist of a piezoelectric actuator in combination with a micrometer screw drive.

  16. SRC-2020 Solar Reference Cell
    Enli Technology Co., Ltd May 29, 2015

    Enlitech's Solar Reference Cell is used for adjusting the intensity of solar simulator and measuring the characterization of I-V which is designed in accordance with WPVS, IEC 60904-2, and ISO 17025.

  17. Image Sensor Characterization System
    Enli Technology Co., Ltd May 29, 2015

    MV-IS is a high-performance measurement system of CCD/CMOS image sensor and camera systems for a variety of applications. The measurement wavelength can be extendable to 300 nm~1100 nm.

  18. NPXY250-405 Piezo Stage
    nPoint Inc. Mar 13, 2015

    The NPXY250-405 piezo stage is the latest addition to nPoint’s nanopositioning lineup. This stage is designed as an economical XY piezo flexure stage.

  19. DSSC Solar Cell Quantum Efficiency Measurement System
    Enli Technology Co., Ltd Feb 17, 2015

    A testing tool to test Quantum Efficiency / Spectral Response / Incident photon to converted electron of solar cells, especially for Dye-sensitized (DSSC) and Photoelectrochemical (PEC) solar cells.

  20. SR-156 Solar Cell Full-Area Spectral Response Measurement System
    Enli Technology Co., Ltd Feb 17, 2015

    A solar cell spectral response measurement system is exclusively designed by Enli Technology Co., Ltd., the full-area (156×156 mm2 ) illumination can measure the spectral response of the whole cell.

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