Scanning probe microscopy
Park Systems New Atomic Force Microscope Technology Surpasses Old Standards
Park Systems Mar 5, 2014
Park Systems New Atomic Force Microscope Technology Surpasses Old Standards for Semiconductor Failure Analysis Detection Ensuring Accuracy and Lowering Costs.
Powerfully Versatile Atomic Force Microscope with Unique MultiSampleTM Scan
Columbus, Ohio (January 23, 2014)- Lake Shore slated to receive Phase II Air Force grant for terahertz system development.
Nanosurf AG Jan 15, 2014
An all-in-one AFM for nano education and small samples.
Park Systems Unveils New Park XE15
Park Systems Jan 6, 2014
Powerfully Versatile Atomic Force Microscope with Unique MultiSample™ Scan.
- the world’s most accurate large sample AFM (200mm sample stage)
- the most affordable research-grade AFM with flexible sample handling Special price of £35,000 + VAT (includes delivery, installation and user training)* * offer can be withdrawn without notice
Park Systems, a leader in AFM since 1997 announced today their first AFM image contest beginning Aug 26-Nov 1, 2013 for scientists, engineers, researchers and others who work with AFM.
Park Systems announced the PinPoint Counductive AFM, an extremely accurate conductive measurement technology at nano-scale resolution for failure analysis (FA) in the semiconductor industry.
Fluid Force Microscopy (FluidFM) combines the unique possibilities of nanofluidics with the positional accuracy and force sensitivity of the atomic force microscope...
NPXY50-286 Nanopositioning Piezo Stage
nPoint Inc. Aug 22, 2013
The NPXY50-286 is the latest addition to nPoint’s piezo stage lineup. The stage is designed for high specification research and OEM markets where small size, fast speed, and high resolution are ideal.
WITec’s RayShield Coupler makes accessible Raman data at low wavenumbers
LOT-QuantumDesign Ltd Aug 15, 2013
WITec’s RayShield Coupler is now available for the alpha300 and alpha500 microscope series. It allows the acquisition of Raman spectra at wavenumbers down to below 10 rel. cm-1.
Quorum Technologies has moved
Quorum Technologies Aug 14, 2013
Quorum Technologies has recently relocated to a new, purpose-built factory and offices in the village of Laughton in East Sussex...
Park Systems Introduces Park NX-HDM
Park Systems Jul 4, 2013
Fully Automated Automatic Defect Review and Sub-Angstrom Surface Roughness for Hard Disk Media and Semiconductor Substrates.
PZ 300 AP - z-axis elevator stage
piezosystem jena GmbH Jun 20, 2013
The PZ 300 AP of piezosystem jena is developed for microscopy techniques and can be used as accessories for microscopes. It provides an accurate and a very quick scanning of a probe on the z-axis.
The new MIPOS 16-158 is specifically designed for high precision positioning of optical systems with an accuracy in the sub-nanometer range. The MIPOS offer new possibilities for optical setups.
Motorized Rotary Stage with High Precision with Air Bearing and Vacuum Option
PI (Physik Instrumente) Piezo Nano Positioning Jun 10, 2013
A variety of high resolution rotation positioners for instrumentation and automation is offered by PI miCos.
positioning actuator PX 500 - piezo based flexure stage with 500micron motion
piezosystem jena GmbH Jun 10, 2013
piezosystem jena, oofers piezo electrical stages for micro- and nanopositioning. The PX 500 piezo positioning stageis made for applications that require fast, accurate opening and closing.
The NEW Park XE-7- Affordable, Research Grade AFM with Flexible Sample Handling
LOT-QuantumDesign Ltd Jun 10, 2013
The Park XE7 is an AFM solution for researchers with a limited budget that does not sacrifice any of the innovative Park AFM technology that sets this product line apart from conventional AFMs.
- a time-correlated single photon counting measurement option For more information please contact Shayz Ikram on 01372 378822 or email firstname.lastname@example.org.