Deposition and coating
Thin Film Thickness Measurement for Sub-micron Samples from Elliot Scientific
Elliot Scientific Ltd. Apr 23, 2009
Thin film thickness measurement on flat panel displays, MEMS and other semicon devices is a common requirement, so Elliot Scientific is now offering the new QDI 2010 Film microspectrophotometer.
The NEW PPMS® DynaCool™ - Cryogen-free Physical Property Measurement System
LOT-QuantumDesign Ltd Apr 3, 2009
System availability: Summer 2010
We will be running demos and events here throughout 2009. To view our diary please go to our website events page http://www.lot-oriel.com/site/pages_uk_en/events/events/events.php
CyberLab bridges fifteen magnitude orders in time from atomic vibration to material growth time.
STS receives order for Pegasus DRIE tool from Georgia Tech
Surface Technology Systems plc Mar 10, 2008
Georgia Inst of Technology orders Pegasus system as part of their new Nanotechnology Research Center