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Scanning probe microscopy

Buyer's guide > Tools, analysis and lab supplies > Scanning probe microscopy

Showing product 481 to 500 of 642 in Scanning probe microscopy.
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  1. Broadcast Fiber Cable Outdoor GYDXTW/GYTA53/GYTA
    Sunrise Fiber Cables Jul 12, 2011

    Broadcast outdoor fiber optic cable provide innovative connectivity solutions for virtually any broadcast application.

  2. Deployable Optical Cable GYTS/GYFTY/GYTY53
    Sunrise Fiber Cables Jul 12, 2011

    These fiber optic patch cords offer a number of advantages for applications requiring long fiber runs, temporary connections.

  3. Multi-Fiber Distribution Cables GYXTW/GYTC8S/GYXTC8S
    Sunrise Fiber Cables Jul 12, 2011

    These fiber patch cable integrate the bandwidth capacity of several individual cable assemblies.

  4. Nano-Indentation / Materials Testing w/ Scanning Probe Microscopy / Piezo Stages
    PI (Physik Instrumente) Piezo Nano Positioning Jul 6, 2011

    A flexible nano-indentation system by Micro Materials Ltd. offers a variety of methods for materials characterization, including nano-indentation, nano-impact and nano-scratch and wear measurements.

  5. Mad City Labs Now Exclusive To Elliot Scientific In UK & Ireland
    Elliot Scientific Ltd. Jun 29, 2011

    Mad City Labs, a leading manufacturer of flexure based nanopositioning systems capable of sub-nanometre positioning resolution has appointed Elliot Scientific as its exclusive UK/Ireland distributor.

  6. Mad City Labs Now Exclusive To Elliot Scientific In UK & Ireland
    Elliot Scientific Ltd. Jun 29, 2011

    Mad City Labs, a leading manufacturer of flexure based nanopositioning systems capable of sub-nanometre positioning resolution has appointed Elliot Scientific as its exclusive UK/Ireland distributor.

  7. Excitation Wavelength Selection with a Flick of the Thumb
    LOT-QuantumDesign Ltd Jun 28, 2011

    New WITec Multi-wavelength Coupling Unit for the alpha300 and alpha500 series.

  8. LOT Metrology Promotions on Stylus/Optical Surface Profilers and AFMs
    LOT-QuantumDesign Ltd Jun 9, 2011

    LOT represent some of the top names in Metrology instrumentation such as KLA Tencor and Park Systems. We are currently offering the following promotions for a limited period:-

  9. Nanopositioning Systems Catalog: Piezo Stages, Motors, Controllers
    PI (Physik Instrumente) Piezo Nano Positioning Jun 8, 2011

    PI, a leading manufacturer of nanopositioning stages & precision motion-control equipment for bio-medical, semiconductor, imaging & nanotechnology applications, releases a new nanopositioning catalog.

  10. Nanotechnology Challenges:Implications for Philosophy, Ethics and Society
    World Scientific Publishing Co. May 3, 2011

    edited by Joachim Schummer (Technical University of Darmstadt, Germany) & Davis Baird (University of South Carolina, USA)

  11. NT-MDT Co. opens a new R&D office in the USA
    NT-MDT Apr 19, 2011

    NT-MDT Development in Tempe, Arizona, is a new team of NT-MDT Co. The experienced AFM developers Sergei Magonov, John Alexander and Sergey Belikov have joined the company.

  12. Nano-Engineering In Science And Technology
    World Scientific Publishing Co. Apr 13, 2011

    An Introduction to the World of Nano-Design
    by Michael Rieth (AIFT, Karlsruhe, Germany)

  13. halcyonics_i4 Active Vibration Isolation Platform
    Stratton Technologies Ltd Mar 30, 2011

    The halcyonics_i4 Active Vibration Isolation Platform is a compact, low profile, benchtop platform for active isolation of scanning microscopes including AFM, SPM, SNOM & SICM.

  14. NT-MDT NTEGRA Spectra AFM-Raman system
    Scanwel Ltd. Mar 29, 2011

    Integrates Atomic Force Microscopy with Raman spectroscopy and optical microscopy to give information on topography, electrical, mechanical, magnetic and chemical properties in a single experiment

  15. DME DualScope 95 AFM
    DME Nanotechnologie GmbH Mar 29, 2011

    The most flexible, high performance, high throughput AFM probe scanner available on the marked

  16. The BRR Microscope
    DME Nanotechnologie GmbH Mar 29, 2011

    Fully integrated hybrid Electron / Scanning Probe Microscope, based on a DME UHV AFM and a Carl Zeiss Auriga(R) Crossbeam Scanning Electron Microscope

  17. AFM Scanner Catalog: Planar Piezo Stages for Atomic Force Microscopes, SPM
    PI (Physik Instrumente) Piezo Nano Positioning Mar 29, 2011

    Piezo nanopositioning stage specialist PI has released a new catalog on planar piezo scanners for Atomic Force Microscopy and Scanning Probe Microscopes.

  18. Ultrasonic Motor Linear Actuator for Precision Automation
    PI (Physik Instrumente) Piezo Nano Positioning Jan 28, 2011

    PI's new M-272 linear actuator for automation applications based on a maintenance-free PILine® ultrasonic ceramic piezo motor. * Fast: 200 mm/sec (8”/sec) * Travel range 50 mm

  19. Nano-Positioning and Piezo Technology Solutions for Medical Design
    PI (Physik Instrumente) Piezo Nano Positioning Jan 5, 2011

    Piezo & Motion Control Specialist PI has published a brochure on advanced motion control solutions for medical design

  20. WITec introduces “True Surface Microscopy” Topographic Confocal Raman Imaging
    LOT-QuantumDesign Ltd Dec 13, 2010

    -The next evolutionary leap in cutting edge microscope configurations

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