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Metrology

Buyer's guide > Tools, analysis and lab supplies > Metrology

Showing product 501 to 520 of 589 in Metrology.
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  1. Beam Steering & Image Stabilization with new Controller
    PI (Physik Instrumente) Piezo Nano Positioning Sep 1, 2009

    Piezo systems specialist PI introduces the E-616 line of multi-channel controllers for piezo steering mirror platforms.

  2. New External Portable Hard Drive Media Player Support Wireless LAN
    Huihong Technologies Aug 10, 2009

    The hard drive media players connects to your wireless access point, thereby opening a new world of multimedia entertainment.

  3. Introducing the Nano-LPQ: Thin, high speed nanopositioning for particle tracking
    Mad City Labs, Inc. - Leading manufacturer of piezo actuators and nanopositioners for nanotechnology Aug 10, 2009

    The Nano-LPQ nanopositioning system features equal speed in XYZ, low profile (21mm), integrated sample holder, picometer precision, 75 x 75 x 50 microns. Ideal for particle tracking and SR microscopy.

  4. New Products & Capabilities Catalogue from Elliot Scientific
    Elliot Scientific Ltd. Aug 4, 2009

    The new and enlarged Elliot Scientific Products & Capabilities Catalogue is now available for download as a PDF from our website.

  5. Universal Hdd Networking Adapter for All SATA Interfaces
    Huihong Technologies Aug 3, 2009

    It is an innovative adapter suitable for all SATA devices, with usb and sata interface support,no need the outside power supply for working.

  6. Ultra-Thin Porous and Non-Porous Silicon TEM Windows
    TEMwindows.com Aug 3, 2009

    Pure Silicon UltraSM® TEM Windows are available as Porous Si Windows with 10-50 nm pores or as ultra-thin Non-Porous Si Windows with thicknesses of 5-15 nm.

  7. Versatile Radiation Controller for Industry and Science
    Scitec Instruments Ltd Jul 13, 2009

    Scitec Instruments has introduced the RADIKON radiation controller, which provides control according to the output from a sensor

  8. Nanosurf easyScan 2 FlexAFM - Your versatile AFM for Materials and Life Science
    Windsor Scientific Ltd Jul 13, 2009

    The FlexAFM brings a new dimension to the easyScan line of SPMs: adding new AFM modes, liquid imaging, ultra-flat scanning, all with the renowned ease-of-use of the Nanosurf range.

  9. CCHR High-resolution Carbon Nanotube Probes for Atomic Force Microscopy (AFM)
    Carbon Design Innovations, Inc. (C|D|I) Jun 18, 2009

    The CCHR high-resolution CNT AFM probes are designed for detailed imaging in metrology and materials science applications. The standard CNT probe length is 500 nm, with the exposed CNT tip <200 nm.

  10. CCHAR High-aspect Ratio CNT Probes for Atomic Force Microscopy (AFM)
    Carbon Design Innovations, Inc. (C|D|I) Jun 18, 2009

    The CCHAR high-aspect ratio CNT AFM probe, are designed for critical dimension measurements and imaging high-Z structures in materials science, metrology and life science applications.

  11. NEW Xi-100 Non-Contact Optical Profiler - Scanning White Light Interferometer
    LOT-QuantumDesign Ltd Jun 16, 2009

    The Xi-100 Non-Contact Optical Interferometer from Ambios Technology quickly and accurately measures the 3D topography of surfaces at the nanometer level.

  12. Green Single-Frequency Low-Noise DPSS Laser
    Scitec Instruments Polska Jun 4, 2009

    A green DPSS laser from Oxxius, emitting up to 300 mW at 532 nm, is now available from Scitec Instruments Polska.

  13. Blue Single-Frequency Low-Noise DPSS Laser
    Scitec Instruments Polska Jun 4, 2009

    A blue DPSS laser from Oxxius, emitting up to 50 mW at 473 nm, is now available from Scitec Instruments Polska.

  14. Multichannel Digital Lock-in Amplifier
    Scitec Instruments Ltd May 22, 2009

    Scitec Instruments has introduced the 450DV2 multichannel digital lock-in amplifier which enables simultaneous processing of up to 16 signals

  15. PI News: P-545 PInano™ Super-Resolution Microscopy Piezo Stage & Controller
    PI (Physik Instrumente) Piezo Nano Positioning May 5, 2009

    The inventor of Piezo-Z nanofocusing drives—has extended its line of piezo stages for super-resolution microscopy.

  16. Thin Film Thickness Measurement for Sub-micron Samples from Elliot Scientific
    Elliot Scientific Ltd. Apr 23, 2009

    Thin film thickness measurement on flat panel displays, MEMS and other semicon devices is a common requirement, so Elliot Scientific is now offering the new QDI 2010 Film microspectrophotometer.

  17. Custom Optics
    Scitec Instruments Ltd Apr 22, 2009

    Scitec Instruments introduces custom optical components and systems from Solaris Optics.

  18. PI News: 2009 Nano Positioning Technology & Piezo Positioning Systems Book by PI
    PI (Physik Instrumente) Piezo Nano Positioning Mar 17, 2009

    Nanopositioning & Piezo Technology Specialist PI has issued the 2009 hard-cover catalog entitled "Piezo Nano Positioning Inspirations 2009". This free guide is a must for any nanotechnology library.

  19. LOT now represent Nanometrics Metrology Systems
    LOT-QuantumDesign Ltd Feb 23, 2009

    LOT now represent Nanometrics for the following products in the UK/Ireland.

  20. Launch of optical filter range
    Elliot Scientific Ltd. Feb 13, 2009

    Elliot Scientific now offers its own range of low-cost high-quality glass filters for research and industry. The filters come as 1/2" (12.5mm) and 1" (25mm) diameters plus 2" (50mm) squares.

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