This site uses cookies. By continuing to use this site you agree to our use of cookies. To find out more, see our Privacy and Cookies policy.
Skip to the content

IOP A community website from IOP Publishing

Product category

Metrology

Buyer's guide > Tools, analysis and lab supplies > Metrology

Showing product 501 to 520 of 583 in Metrology.
Result page: « Previous 17 18 19 20 21 22 23 24 25 26 27 28 29 30 Next »

  1. Versatile Radiation Controller for Industry and Science
    Scitec Instruments Ltd Jul 13, 2009

    Scitec Instruments has introduced the RADIKON radiation controller, which provides control according to the output from a sensor

  2. Nanosurf easyScan 2 FlexAFM - Your versatile AFM for Materials and Life Science
    Windsor Scientific Ltd Jul 13, 2009

    The FlexAFM brings a new dimension to the easyScan line of SPMs: adding new AFM modes, liquid imaging, ultra-flat scanning, all with the renowned ease-of-use of the Nanosurf range.

  3. CCHR High-resolution Carbon Nanotube Probes for Atomic Force Microscopy (AFM)
    Carbon Design Innovations, Inc. (C|D|I) Jun 18, 2009

    The CCHR high-resolution CNT AFM probes are designed for detailed imaging in metrology and materials science applications. The standard CNT probe length is 500 nm, with the exposed CNT tip <200 nm.

  4. CCHAR High-aspect Ratio CNT Probes for Atomic Force Microscopy (AFM)
    Carbon Design Innovations, Inc. (C|D|I) Jun 18, 2009

    The CCHAR high-aspect ratio CNT AFM probe, are designed for critical dimension measurements and imaging high-Z structures in materials science, metrology and life science applications.

  5. NEW Xi-100 Non-Contact Optical Profiler - Scanning White Light Interferometer
    LOT-QuantumDesign Ltd Jun 16, 2009

    The Xi-100 Non-Contact Optical Interferometer from Ambios Technology quickly and accurately measures the 3D topography of surfaces at the nanometer level.

  6. Green Single-Frequency Low-Noise DPSS Laser
    Scitec Instruments Polska Jun 4, 2009

    A green DPSS laser from Oxxius, emitting up to 300 mW at 532 nm, is now available from Scitec Instruments Polska.

  7. Blue Single-Frequency Low-Noise DPSS Laser
    Scitec Instruments Polska Jun 4, 2009

    A blue DPSS laser from Oxxius, emitting up to 50 mW at 473 nm, is now available from Scitec Instruments Polska.

  8. Multichannel Digital Lock-in Amplifier
    Scitec Instruments Ltd May 22, 2009

    Scitec Instruments has introduced the 450DV2 multichannel digital lock-in amplifier which enables simultaneous processing of up to 16 signals

  9. PI News: P-545 PInano™ Super-Resolution Microscopy Piezo Stage & Controller
    PI (Physik Instrumente) Piezo Nano Positioning May 5, 2009

    The inventor of Piezo-Z nanofocusing drives—has extended its line of piezo stages for super-resolution microscopy.

  10. Thin Film Thickness Measurement for Sub-micron Samples from Elliot Scientific
    Elliot Scientific Ltd. Apr 23, 2009

    Thin film thickness measurement on flat panel displays, MEMS and other semicon devices is a common requirement, so Elliot Scientific is now offering the new QDI 2010 Film microspectrophotometer.

  11. Custom Optics
    Scitec Instruments Ltd Apr 22, 2009

    Scitec Instruments introduces custom optical components and systems from Solaris Optics.

  12. PI News: 2009 Nano Positioning Technology & Piezo Positioning Systems Book by PI
    PI (Physik Instrumente) Piezo Nano Positioning Mar 17, 2009

    Nanopositioning & Piezo Technology Specialist PI has issued the 2009 hard-cover catalog entitled "Piezo Nano Positioning Inspirations 2009". This free guide is a must for any nanotechnology library.

  13. LOT now represent Nanometrics Metrology Systems
    LOT-QuantumDesign Ltd Feb 23, 2009

    LOT now represent Nanometrics for the following products in the UK/Ireland.

  14. Launch of optical filter range
    Elliot Scientific Ltd. Feb 13, 2009

    Elliot Scientific now offers its own range of low-cost high-quality glass filters for research and industry. The filters come as 1/2" (12.5mm) and 1" (25mm) diameters plus 2" (50mm) squares.

  15. Refurbished KLA-Tencor Surface Inspection Systems
    ClassOne Equipment, Inc. Feb 9, 2009

    ClassOne specializes in the sale of refurbished KLA-Tencor Surface Inspection Systems. Each system is refurbished by KLA factory trained technicians and is sold with a 6 month warranty.

  16. The SOLVER NEXT is the first to offer a new concept in general purpose SPM
    NT-MDT Dec 15, 2008

    The system offers complete automation, intelligent software and ergonomic design making this general-purpose SPM acceptable for state-of-the-art scientific laboratories and multi user facilities.

  17. Narrow bandpass filter
    TEMTO Technology Co., Ltd Nov 13, 2008

    Temto process the narrow bandpass filter under 1100nm, hereunder is the filter list within our capability.

  18. Force Measurement added to the Elliot Scientific Optical Tweezer range
    Elliot Scientific Ltd. Nov 10, 2008

    The new E4100 QPD Force Measurement Optical Tweezer System uses a Quadrant Photo Detector (QPD) and powerful software to detect and measure the single trap stiffness of a captured particle.

  19. NuLasers Ltd. offers miniature 488 nm laser diode module
    NuLasers Ltd. Nov 3, 2008

    NuLasers Ltd. markets temperature stabilized laser diode modules with a head size of just 30 x 31 x 34 mm.

  20. For In-Line Pole Tip Recession Metrology of Hard Disk Sliders
    Park Systems Oct 2, 2008

    XE-PTR

Result page: « Previous 17 18 19 20 21 22 23 24 25 26 27 28 29 30 Next »