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Scanning probe microscopy

Buyer's guide > Tools, analysis and lab supplies > Scanning probe microscopy

Showing product 541 to 560 of 639 in Scanning probe microscopy.
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  1. Silicon Nitride TEM Windows
    TEMwindows.com Jul 31, 2009

    High-quality Silicon nitride TEM windows feature 50 nm thick. low-stress nitride in a variety of window formats.

  2. Custom TEM Windows
    TEMwindows.com Jul 31, 2009

    We provide fabrication services for custom TEM windows and other silicon wafer-based, ultra-thin membrane devices. Please contact us with detailed specifications.

  3. CWDM Fiber Optic Multiplexer for Outside Plant
    Infini Fiber Optic Cable, Inc Jul 20, 2009

    this rugged optical add/drop multiplexer provide a flexible and cost effective solution to enable capacity expansion of existing fiber,configurable for bidirectional or unidirectional transport.

  4. Nanosurf easyScan 2 FlexAFM - Your versatile AFM for Materials and Life Science
    Windsor Scientific Ltd Jul 13, 2009

    The FlexAFM brings a new dimension to the easyScan line of SPMs: adding new AFM modes, liquid imaging, ultra-flat scanning, all with the renowned ease-of-use of the Nanosurf range.

  5. Introducing the Nano-LPS Series: Slim piezo nanopositioner for nano-metrology
    Mad City Labs, Inc. - Leading manufacturer of piezo actuators and nanopositioners for nanotechnology Jun 24, 2009

    The Nano-LPS Series of highly stable piezo nanopositioners are slim (20mm) with 83mm centre aperture, picometer precision and up to 300 microns travel in XYZ. Ideal for SR microscopy, nano-metrology.

  6. CCHR High-resolution Carbon Nanotube Probes for Atomic Force Microscopy (AFM)
    Carbon Design Innovations, Inc. (C|D|I) Jun 18, 2009

    The CCHR high-resolution CNT AFM probes are designed for detailed imaging in metrology and materials science applications. The standard CNT probe length is 500 nm, with the exposed CNT tip <200 nm.

  7. CCHAR High-aspect Ratio CNT Probes for Atomic Force Microscopy (AFM)
    Carbon Design Innovations, Inc. (C|D|I) Jun 18, 2009

    The CCHAR high-aspect ratio CNT AFM probe, are designed for critical dimension measurements and imaging high-Z structures in materials science, metrology and life science applications.

  8. Researchers win $25000 NanoInnovation Grant™ forFast Mechanical Nanostimulator
    PI (Physik Instrumente) Piezo Nano Positioning Jun 15, 2009

    August 2007, Andrea Lelli, Eric A. Stauffer and Jeffrey R. Holt, Department of Neuroscience, University of Virginia Medical School have won the $25,000 PI (Physik Instrumente) NanoInnovation Grant™

  9. MFP-3D Family of AFMs
    Asylum Research, the Technology Leader in Atomic Force/Scanning Probe Microscopes May 27, 2009

    The MFP-3D family includes MFP-3D-BIO, MFP-3D Standalone, MFP-3D CF (confocal), and the MFP Nanoindenter.

  10. The Cypher Atomic Force Microscope
    Asylum Research, the Technology Leader in Atomic Force/Scanning Probe Microscopes May 27, 2009

    Cypher is the world’s highest resolution, achieving closed loop atomic resolution using patented sensor technology for all three axes for the most accurate images and measurements possible today.

  11. WITec Project Plus
    LOT-QuantumDesign Ltd May 8, 2009

    - New Chemometric Software for Raman Spectral and Microscopic Data Analysis

  12. PI News: P-545 PInano™ Super-Resolution Microscopy Piezo Stage & Controller
    PI (Physik Instrumente) Piezo Nano Positioning May 5, 2009

    The inventor of Piezo-Z nanofocusing drives—has extended its line of piezo stages for super-resolution microscopy.

  13. Custom Optics
    Scitec Instruments Ltd Apr 22, 2009

    Scitec Instruments introduces custom optical components and systems from Solaris Optics.

  14. WITec Alpha Series of SPM, Confocal Raman/SNOM Microscopes
    LOT-QuantumDesign Ltd Mar 27, 2009

    A Modular Product Line - Flexibility for almost any microscopy application you may encounter

  15. 5600 Large Stage Atomic Force Microscope
    Agilent Technologies Inc Mar 19, 2009

    Agilent Technologies Expands Capabilities of Highly Versatile Atomic Force Microscope for Large and Small Samples

  16. The Ambios Q-Scope™ Scanning Probe Microscope
    LOT-QuantumDesign Ltd Mar 18, 2009

    - the industry’s most cost-effective, complete, and turnkey SPM/AFM systems available

  17. PI News: 2009 Nano Positioning Technology & Piezo Positioning Systems Book by PI
    PI (Physik Instrumente) Piezo Nano Positioning Mar 17, 2009

    Nanopositioning & Piezo Technology Specialist PI has issued the 2009 hard-cover catalog entitled "Piezo Nano Positioning Inspirations 2009". This free guide is a must for any nanotechnology library.

  18. Anti-vibration Tables from Elliot Scientific keep lightweights afloat
    Elliot Scientific Ltd. Jan 26, 2009

    The new Kinetic Systems’ 2800 Series LLHP ultra-low-frequency (ULF) Vibration-Isolation Workstation for lighter loads has been introduced to the UK and Ireland by Elliot Scientific.

  19. New Demonstration Laboratory Facilities at LOT UK
    LOT-QuantumDesign Ltd Jan 5, 2009

    We will be running demos and events here throughout 2009. To view our diary please go to our website events page http://www.lot-oriel.com/site/pages_uk_en/events/events/events.php

  20. The SOLVER NEXT is the first to offer a new concept in general purpose SPM
    NT-MDT Dec 15, 2008

    The system offers complete automation, intelligent software and ergonomic design making this general-purpose SPM acceptable for state-of-the-art scientific laboratories and multi user facilities.

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