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In depth

Mar 17, 2008

AFM tools: cutting big problems down to size

In order to squeeze more functions into smaller packages, designers of electronic devices are increasingly creating structures with dimensions and shapes that are difficult to measure with traditional tools. To tackle the problem, engineers are turning to atomic force microscopes (AFMs) thanks to the instrument's ability to map surface topography with nanometre precision. Sung Park looks at the innovations behind some of today's AFM solutions.

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