Aug 15, 2012
Conductive AFM probes grain boundaries and wrinkles in graphene
Muneer Ahmad and colleagues at the Graphene Research Institute, Sejong University, South Korea, are working on the application of graphene in flexible electronics such as conductive transparent electrodes for touchscreen panels. Using conductive atomic force microscopy, the team is investigating the role of grain boundaries and mechanical deformations on the conductivity of the material.
The team has shown experimentally that the misorientation of grain boundaries and the introduction of wrinkles due to mechanical deformations substantially reduce the conductivity of graphene. In particular, the grain boundaries were found to be more resistive compared with the wrinkles.
The findings should help in the design of future graphene devices especially where large-area graphene films are to be implemented, such as touchscreen panels and solar-cell electrodes.
Now the researchers are busy optimizing growth conditions for making graphene via chemical vapour deposition so that grain boundaries are properly oriented to obtain superior charge transport.
Further details can be found in the journal Nanotechnology.
About the author
Dr Muneer Ahmad is working as a postdoc fellow with Prof. Yongho Seo at the Graphene Research Institute, Sejong University, Seoul, South Korea.