[excerpt from Nanotechnology 25 480501]

In scanning tunneling potentiometry, while a current is run laterally through the sample, the voltage applied between the tip and the surface is adjusted during scanning such that the tip-sample current is nullified. In this way, the electrochemical potential drop is measured locally. This method can be used to obtain information about electronic scattering at defects, where a significant local potential drop occurs; however, atomic resolution was lacking so far.

Bevan presents an interesting computational approach on scanning tunnelling potentiometry in which he describes measurable atomistic features. Using density functional theory, Bevan predicts such features in the immediate vicinity of an opaque grain boundary on graphene…

Viewpoints are a new article type in Nanotechnology where we invite a member of the research community to comment on a recently published paper in the journal.

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