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Technology update

Aug 14, 2007

Twisting time for AFM

A new atomic force microscope (AFM) that can measure the mechanical properties of a material a thousand times faster than conventional AFMs has been developed by researchers in the US. The AFM, made by Ozgur Sahin of Harvard University and colleagues at Stanford University and Veeco Instruments, measures the twisting, or torsional, vibrations from the AFM cantilever. This is possible because the AFM tip is placed at one side of the cantilever, which is quite different to traditional devices where it is placed at the centre.

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