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Technology update

Feb 25, 2008

X-ray microscope unearths nanostructures

Researchers have succeeded in imaging buried nanoscale structures down to a pixel resolution of just 15 nm for the first time. Jianwei Miao and Changyong Song of the University of California at Los Angeles and colleagues employed a technique called resonant X-ray diffraction microscopy to image buried bismuth dopants inside a micron-sized silicon crystal. The method can identify specific elements and could be used to image a range of systems, including magnetic materials, semiconductors and biological samples.

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