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  • An introduction to particle size characterisation by DCS
  • Quantitative particle size distribution analysis by Laser Diffraction and Differential Centrifugal Sedimentation
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Aug 31, 2010

Full field nano imprint on mask aligners using substrate conformal imprint lithography technique

Nowadays, the development of integrated circuit (IC) industry and scientific researches rely more and more on the nanofabrication technologies. The resolution limits of optical lithography are very real even with a number of "optical tricks" at work. E-beam lithography provides excellent resolution down to several nanometers…

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