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Latest White papers

Contact jayne.orsborn@iop.org to find out more about sharing your data on nanotechweb.org.

The real-time visualisation and size analysis of nanoparticles in liquids – nanoparticle tracking analysis. Sep 3, 2008

Application note from Robert Carr, Jonathan Smith, Patrick Hole, Andrew Malloy, Philip Nelson and Jeremy Warren from Nanosight Ltd and Lost Artifact Ltd

Photovoltaic applications using spectroscopic ellipsometry Aug 5, 2008

Application note from LOT Oriel Ltd & J.A. Woollam Co., Inc.

Phenom – the perfect addition to your semi lab. Aug 5, 2008

Application note from LOT Oriel Ltd & FEI Company

Basics of Zeta potential Aug 4, 2008

Agilent Technologies application note.

Purification of nanoparticles by hollow fiber diafiltration Jun 5, 2008

D. Bianchi, D. Serway and W.A. Tamashiro, Spectrum Laboratories, US

Needle Sensor Operation in non-contact AFM Mode May 15, 2008

Nanonis application note by L.Bolotov, AIST, Tsukuba, Japan

Single pass Kelvin Probe Measurement Technique in Air with Dual-OC4 May 15, 2008

Nanonis application note by H.Diesinger, D.Deresmes, and Th. Melin, IEMN, Lille, France

Compensating for CPD in NC-AFM: AM-KPFM in UHV using Dual - OC4 May 15, 2008

by Th. Glatzel and E. Meyer, University of Basel, Switzerland

Hybrid nanopositioning mechanism combines advantages of dc-servo and piezo drive technology Apr 24, 2008

Physik Instrumente

Accurate quantitative thin film depth profiling by ion beam analysis Apr 10, 2008

Chris Jeynes, University of Surrey Ion Beam Centre

Multidimensional microscopy on living cells Mar 6, 2008

JPK Instruments application report

Imaging organic compound assemblies. Oligomers, polymers and Mar 6, 2008

JPK Instruments application report

Combining atomic force microscopy and laser scanning confocal microscopy Mar 6, 2008

JPK Instruments technical report

High resolution imaging with the NanoWizard BioAFM Mar 6, 2008

JPK Instruments application report

Structural investigation of single biomolecules Mar 6, 2008

JPK Instruments application report

Improving low current measurements on nanoelectronic and molecular electronic devices Mar 3, 2008

Jonathan L. Tucker, Keithley Instruments, Inc.

Spin valves investigated with BEMM – a case for Nanonis's programming interface Oct 1, 2007

Nanonis application note

Optimizing PLL feedback parameters: Nanonis perfect PLL Oct 1, 2007

Nanonis application note