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Company details

Hiden Analytical Limited Jan 12, 2012

About this company

Hiden Analytical Limited
420 Europa Boulevard
Warrington
Cheshire
WA5 7UN
United Kingdom

Tel: +44 (0)1925 445225
Fax: +44 (0)1925 416518

For 30 years Hiden Analytical has been a global leader in the design and manufacture of scientific instruments for research, development and production applications.

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Hiden’s quadrupole mass spectrometers provide vacuum, plasma and surface analysis in nanotechnology applications, including SIMS depth profiling of nanometre scale thin film structures, plasma characterisation for enhancement of device etch processes, and vacuum diagnostics / temperature programmed desorption analysers in UHV scanning tunnelling microscopes.

Hiden Analytical was founded in 1981 and is presently situated in a 2,130m2 manufacturing plant in Warrington, England with a staff of 60. As a privately owned company our reputation is built on creating close and positive relationships with our clients. Many of these customers are working at the forefront of new technology - in the fields of plasma research, surface science, vacuum processing and gas analysis. To maintain this reputation we have, over the years, established exceptional levels of technical expertise in these areas within our company.

Hiden Analytical is committed to providing systems which meet specifications of both new and existing clients, but further, enable the advancement of their work, whether it be pure research or the improvements or monitoring of products and process performance. We have a common vision, not only to supply the systems and instruments with first class performance specifications, long term reliability and professional service support, but also, and in many cases more importantly, to maintain close contact to ensure that our systems provide all that our customers expect, and more, from their investment in our organisation.

The Hiden Analytical UHV surface analysis system range is further extended by the addition of ‘MAXIM’, a high-performance quadrupole secondary ion monitor specifically designed for optimum sensitivity for surface analysis and depth profiling applications for a wide range of materials including polymers, superconductors, semiconductors, alloys and dielectric, with measurement of trace components to sub-ppm levels.

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Products from this company

  1. SIMS Workstation, a UHV Surface Analysis System, for thin film depth profiling Jan 11, 2012

    The Hiden SIMS Workstation, an integrated UHV / SIMS facility for advanced surface analysis.

  2. TPD Workstation for UHV Thermal Desorption Studies Jan 11, 2012

    The Hiden TPD Workstation is a complete experimental system for UHV temperature programmed desorption (TPD) studies

  3. XBS Triple Filter Mass Spectrometer Jan 11, 2012

    Configured for multiple source monitoring in MBE deposition applications. Custom configured ioniser provides for high stability & senstivity monitoring of oxides & metals from k-cell & e-gun sources.

  4. Atmospheric Gas Analysis System - QGA Feb 23, 2011

    The Hiden QGA is a compact bench-top gas analysis system for real time gas and vapour analysis.

  5. Hiden Ion Milling Probe – End Point Detector Sep 28, 2010

    The only dedicated end point determination tool for ion etch control & optimum process quality.

  6. Residual Gas Analysers for Vacuum Diagnostics and Leak Detection Sep 28, 2010

    Hiden RGA series quadrupole mass spectrometers for the examination of components present in a vessel or evolved from a process.

  7. ESPion, an Advanced Langmuir Probe for Plasma Diagnostics Sep 28, 2010

    The most advanced and reliable Langmuir Probe

  8. Multi Stream Gas/Vapour Analyser - QIC Biostream Sep 28, 2010

    The QIC Biostream multi-stream gas analysis system for the monitoring & analysis of gases, vapours & processes.

  9. Hiden HPR-20 QIC Real time gas analyser for multi-species gas & vapour analysis Sep 28, 2010

    The HPR QIC-20 gas analysis system is a compact bench-top gas analysis system for monitoring gases and processes at pressures up to atmosphere.

  10. EQS, a Secondary Ion Mass Spectrometer bolt on SIMS Analyser Sep 28, 2010

    State of the art, bolt-on SIMS probe for integration into your existing UHV surface science chamber. Suitable for FIB-SIMS integration and compatible with the Hiden SIMS Workstation

  11. Secondary ion mass spectrometer for UHV surface analysis & SNMS. The Hiden MAXIM Sep 28, 2010

    A state of the art secondary ion mass spectrometer for static and dynamic SIMS and SNMS applications.