Hiden Analytical Limited Jan 12, 2012
About this company
Hiden Analytical Limited
420 Europa Boulevard
+44 (0)1925 445225
Fax: +44 (0)1925 416518
For 30 years Hiden Analytical has been a global leader in the design and manufacture of scientific instruments for research, development and production applications.
Hiden’s quadrupole mass spectrometers provide vacuum, plasma and surface analysis in nanotechnology applications, including SIMS depth profiling of nanometre scale thin film structures, plasma characterisation for enhancement of device etch processes, and vacuum diagnostics / temperature programmed desorption analysers in UHV scanning tunnelling microscopes.
Hiden Analytical was founded in 1981 and is presently situated in a 2,130m2 manufacturing plant in Warrington, England with a staff of 60. As a privately owned company our reputation is built on creating close and positive relationships with our clients. Many of these customers are working at the forefront of new technology - in the fields of plasma research, surface science, vacuum processing and gas analysis. To maintain this reputation we have, over the years, established exceptional levels of technical expertise in these areas within our company.
Hiden Analytical is committed to providing systems which meet specifications of both new and existing clients, but further, enable the advancement of their work, whether it be pure research or the improvements or monitoring of products and process performance. We have a common vision, not only to supply the systems and instruments with first class performance specifications, long term reliability and professional service support, but also, and in many cases more importantly, to maintain close contact to ensure that our systems provide all that our customers expect, and more, from their investment in our organisation.
The Hiden Analytical UHV surface analysis system range is further extended by the addition of ‘MAXIM’, a high-performance quadrupole secondary ion monitor specifically designed for optimum sensitivity for surface analysis and depth profiling applications for a wide range of materials including polymers, superconductors, semiconductors, alloys and dielectric, with measurement of trace components to sub-ppm levels.
- Optical microscopy
- Scanning probe microscopy
- Electron microscopy
- Carbon nanomaterials
- Non-carbon nanomaterials
- Nanocomposites, hybrid structures and porous materials
- Lithography and etching
- Deposition and coating
- Plasma treatment
- Quantum dots
- Nanowires and waveguiding
- Transistor structures and integrated electronics
- Energy generation and storage
- Memory structures (including spintronics)
- Light sources
- Optical detection
- Drug delivery
- Medical imaging
- DNA manipulation and analysis
- Antibacterial coatings
- Gas and flow sensing
Products from this company
The Hiden SIMS Workstation, an integrated UHV / SIMS facility for advanced surface analysis.
TPD Workstation for UHV Thermal Desorption Studies Jan 11, 2012
The Hiden TPD Workstation is a complete experimental system for UHV temperature programmed desorption (TPD) studies
XBS Triple Filter Mass Spectrometer Jan 11, 2012
Configured for multiple source monitoring in MBE deposition applications. Custom configured ioniser provides for high stability & senstivity monitoring of oxides & metals from k-cell & e-gun sources.
Atmospheric Gas Analysis System - QGA Feb 23, 2011
The Hiden QGA is a compact bench-top gas analysis system for real time gas and vapour analysis.
Hiden Ion Milling Probe – End Point Detector Sep 28, 2010
The only dedicated end point determination tool for ion etch control & optimum process quality.
Hiden RGA series quadrupole mass spectrometers for the examination of components present in a vessel or evolved from a process.
The most advanced and reliable Langmuir Probe
Multi Stream Gas/Vapour Analyser - QIC Biostream Sep 28, 2010
The QIC Biostream multi-stream gas analysis system for the monitoring & analysis of gases, vapours & processes.
The HPR QIC-20 gas analysis system is a compact bench-top gas analysis system for monitoring gases and processes at pressures up to atmosphere.
State of the art, bolt-on SIMS probe for integration into your existing UHV surface science chamber. Suitable for FIB-SIMS integration and compatible with the Hiden SIMS Workstation
A state of the art secondary ion mass spectrometer for static and dynamic SIMS and SNMS applications.