LOT-QuantumDesign Ltd Jan 8, 2013

Products from this company

1. The next generation of Stylus Surface Profilers Jan 17, 2013

   We are pleased to announce the launch of the new P-7 and P-17 Stylus profilers from KLA Tencor. Applications include:- • Wafers • Thin films • MEMS • Data storage • Hard disks • Roughness

2. LOT-QuantumDesign appointed UK distributor of the JEOL NeoScope II benchtop SEM Jan 8, 2013

   The new NeoScope II is a touch panel controlled, multi functional desktop scanning microscope that answers the increasingly diversified needs among users worldwide.

3. Low cost Solar Simulator - now available for demonstration Jul 4, 2012

   LOT now have a complete low cost solar simulator system available for demonstration.

4. LOT's New Online Product Guide 2012 Jul 4, 2012

   LOT Oriel can provide you with information on various tools that may assist you with your work.

5. Rent a Thermal Imaging Camera from LOT May 15, 2012

   Renting is ideal for short-term applications, pre-purchase evaluation, or to temporarily replace a thermal imaging camera that's in for service.

6. LOT Oriel UK teams up with Andor Technology Apr 3, 2012

   LOT UK is pleased to announce that it is now an official distributor for Andor Technology in the UK.

7. LOT launch the IBIS Nanoindentation Tester from Fischer Cripps in the UK Nov 14, 2011

   IBIS is a precision nanoindentation tester offering traceable calibration, robust design, closed loop operation, solid theoretical base, and unmatched accuracy, reliability and price.

8. Summer Sale on all ILT Light Meters and Detectors 10% off until End August 2011 Jul 7, 2011

   (offer only available in UK/Ireland) LOT are offering 10% off all ILT Light Meters and Detectors until the end of August 2011.

9. Excitation Wavelength Selection with a Flick of the Thumb Jun 28, 2011

   New WITec Multi-wavelength Coupling Unit for the alpha300 and alpha500 series.

10. Andover's Optical Filters – Prices have been greatly reduced on all filters Jun 21, 2011

    Optical Filters For Aerospace, Medical, Machine Vision, Astronomy, Space-borne and Defence Systems We now accept VISA, VISA Debit, Mastercard and VISA Electron for these products.

11. LOT Metrology Promotions on Stylus/Optical Surface Profilers and AFMs Jun 9, 2011

    LOT represent some of the top names in Metrology instrumentation such as KLA Tencor and Park Systems. We are currently offering the following promotions for a limited period:-

12. LOT launch a new online Light Source Catalogue Jun 7, 2011

    Our expertise in offering the complete solution...

13. A Low Cost Solar Simulator from Abet Technologies May 16, 2011

    - complete system with 35mm beam size & AM 1.5G filter included

14. WITec introduces “True Surface Microscopy” Topographic Confocal Raman Imaging Dec 13, 2010

    -The next evolutionary leap in cutting edge microscope configurations

15. The New Nuance TRIO Multispectral Imaging System - Introductory price of £19,950 Dec 9, 2010

    Nuance™ TRIO is the newest addition to the Nuance product family.

16. The widest choice of Stylus and Optical Profiling tools available today Jun 24, 2010

    LOT are proud to be recently appointed as the UK/Ireland distributor for KLA Tencor Stylus & Optical Surface Profilers.

17. LOT now offer the Cryostation from Montana Instruments Jun 1, 2010

    The Cryostation is a Helium-free 3K – 350K optical measurement instrument.

18. NEW Quantum Design PPMS EverCool-II™ – cryogen-free cooling technology May 19, 2010

    The Quantum Physical Property Measurement System (PPMS) EverCool-II™ dewar is the second generation of low-loss dewars with integrated Helium liquefier for the PPMS system from Quantum Design.

19. New LOT Oriel Tips E-Store Now Open May 6, 2010

    Please visit our new store for more details http://www.lot-oriel.com/site/pages_uk_en/products/cantilevers/cantilevers.php

20. Anasys NanoIR – Nanoscale IR spectroscopy and thermal analysis May 4, 2010

    LOT now offer the Nanoscale IR from Anasys Instruments.

21. LOT appointed UK and Ireland distributor for Park Systems AFM instrumentation Apr 7, 2010

    Park Systems – Excellence in Nanometrology

22. The NEW J A Woollam T-Solar™ Ellipsometer Feb 24, 2010

    - Optimised to measure the widest range of Photovoltaic Thin Films

23. Free Two Week Evaluation of the J A Woollam Alpha-SE™ Spectroscopic Ellipsometer Jan 22, 2010

    The new generation Alpha SE™ JA Woollam line of ellipsometers now comes with FOUR angles of incidence for modelling complex layered samples & also an optional liquid cell.

24. Trial period option on the Nuance Multispectral Imaging System Jan 22, 2010

    The Nuance is currently being offered on a 30 day sale or return basis to allow assessment of the technology in relation to a specific application prior to purchasing.

25. LOT offer a new range of standard monochromatic light source packages Jan 18, 2010

    Configuring a complete monochromatic light source with its various options can be a difficult task which is why LOT now offer a range of standard monochromator light source packages.

26. NEW Quantum Design PPMS Scanning Probe Microscopy Inserts Dec 7, 2009

    Our new partner attocube has recently introduced a highly sophisticated yet easy-to-use scanning probe microscope - the new PPMS®-SPM.

27. NEW Abet "Class AAA" Sun 3000 Solar Simulators Dec 3, 2009

    Unrivalled illumination efficiency with comprehensive specification at no extra cost

28. NEW Hydra Probe Series – The world’s first truly hybrid probes Dec 3, 2009

    The HYDRA probe series from APPNANO are the world’s first truly hybrid probes having low stress SILICON NITRIDE CANTILEVERS integrated with single crystal SILICON TIPS.

29. NEW LEJ Light Source for fluorescence excitation in Microscopy Nov 19, 2009

    This compact device is the ideal external light source for fluorescence excitation in microscopy.

30. A NEW comprehensive range of light source packages and accessories from LOT Nov 10, 2009

    Choosing the right light source for a specific application requires a detailed knowledge about the application and specifications regarding sample illumination and modern light source technology.

31. NEW Oculus Single Channel Detectors Sep 24, 2009

    Plug and play USB photodiode detectors/gated optical integrators covering 200 - 1700 nm

32. NEW Xi-100 Non-Contact Optical Profiler - Scanning White Light Interferometer Jun 16, 2009

    The Xi-100 Non-Contact Optical Interferometer from Ambios Technology quickly and accurately measures the 3D topography of surfaces at the nanometer level.

33. NanoInk Dip Pen Nanolithography® Jun 8, 2009

    Learn how it works by clicking here for the new video http://www.lot-oriel.com/site/pages_uk_en/products/nlp_2000/nlp_2000.php

34. WITec Project Plus May 8, 2009

    - New Chemometric Software for Raman Spectral and Microscopic Data Analysis

35. New Spequest - for Spectral Response Characterisation of Solar Cells May 8, 2009

    ·Complete turnkey solution for spectral characterisation ·Modular setup for maximum flexibility ·All type of solar cells: polysilicon, c-Si, mc-Si, nc-Si

36. The NEW PPMS® DynaCool™ - Cryogen-free Physical Property Measurement System Apr 3, 2009

    System availability: Summer 2010

37. WITec Alpha Series of SPM, Confocal Raman/SNOM Microscopes Mar 27, 2009

    A Modular Product Line - Flexibility for almost any microscopy application you may encounter

38. New LOT Light Source packages now available – from 50W to 1000W Mar 25, 2009

    LOT have put together new light sources packages for 50-1000W. Many configurations are possible and all packages include required fittings and 2 years warranty.

39. LOT: International Light Technologies - Light Measurement Instrumentation Mar 23, 2009

    LOT represent International Light Technologies in the UK/Ireland for the following products:-

40. The Ambios Q-Scope™ Scanning Probe Microscope Mar 18, 2009

    - the industry’s most cost-effective, complete, and turnkey SPM/AFM systems available

41. NEW Complete IV Curve Measurement System Feb 27, 2009

    The first class Solar Simulators and probe stations of Abet Technologies are combined with high quality measurement instruments and the ReRa Tracer software.

42. LOT now represent Nanometrics Metrology Systems Feb 23, 2009

    LOT now represent Nanometrics for the following products in the UK/Ireland.

43. LOT and Andover Corporation - Download or request the new catalogue Feb 3, 2009

    To download or request a catalogue please go to http://www.lot-oriel.com/site/pages_uk_en/products/optical_filters/optical_filters.php. Prices are also available online.

44. Request your CRi Nuance multispectral imaging system demonstration Jan 28, 2009

    LOT is offering a demonstration of the CRi Nuance multispectral imaging system at your site during Spring 09

45. New Demonstration Laboratory Facilities at LOT UK Jan 5, 2009

    We will be running demos and events here throughout 2009. To view our diary please go to our website events page http://www.lot-oriel.com/site/pages_uk_en/events/events/events.php

46. The NEW AccuMap® SE from J A Woollam Dec 10, 2008

    - for photovoltaic and flat panel display applications

47. The NEW Q-Scope White Light Interferometer/SPM from Ambios Technology Dec 10, 2008

    Q-View is a micro-interferometer module that has been seamlessly integrated into the Q-Scope SPM. This combination provides two synergistic technologies on a single platform.

48. LOT appointed as agents for the Ambios XP-Plus Series of Stylus Profilers May 8, 2008

    World-Class performance combined with exceptional value

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