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Park Systems Jun 18, 2008

About this company

Park Systems
KANC 4F, Iui-Dong 906-10
Suwon
Korea
Korea, Republic of

Tel: +82-31-546-6800
Fax: +82-31-546-6805

Park Systems is the Atomic Force Microscope(AFM) technology leader, providing products that address the requirements of all research and industrial nanoscale applications. All systems are fully compatible with innovative and powerful options.

The product line of Park Systems reflects our focused strength in nanometrology applications. The company's comprehensive portfolio of products, software, services, and expertise is designed and engineered to help customers achieve the metrology performance that meets the needs
and requirements of present and future applications.

In a nanoscale measurement, a repeatable, reproducible, and reliable measurement is just as important as nanoscale resolution. The innovative metrology platform of the XE-AFM ushered a new era of nanometrology that overcomes non-linearity and non-orthogonality associated with conventional piezoelectric tube based AFM. The XE-AFM is a disruptive market force that has far reaching consequences, in that it expands the application of nanometrology beyond what has been previously made possible with conventional AFM technology.

 

Products from this company

  1. Park Systems: NX10 Dec 8, 2011

    Park Systems: NX10

  2. Park Systems: XE-70 Dec 8, 2011

    Affordable Research-Grade AFM with Flexible Sample Handling

  3. Park Systems: XE-100 Dec 8, 2011

    Award-Winning Research-grade AFM with Step-and-Scan Automation

  4. Park Systems: XE-120 Dec 8, 2011

    Take the award-winning XE-100, shrink it such that it can be placed on top of the many popular inverted optical microscopes, and you have the versatile XE-120,

  5. Park Systems: XE-150 Dec 8, 2011

    Premier Cross-Functional AFM with Motorized Sample Stage

  6. Park Systems: XE-Bio Dec 8, 2011

    Non Contact In-liquid Imaging and Ion Conductance Microscopy

  7. Park Systems: XE-NSOM Dec 8, 2011

    Near-field Scanning Optical Microscopy built on Artifact-Free Imaging XE Platform

  8. Park Systems: XE-3DM Dec 8, 2011

    Automated Industrial AFM for High-Resolution 3D Metrology

  9. Park Systems Japan to Sponsor AFM Bio-Imaging Forum Nov 24, 2011

    Park Systems Japan to Sponsor AFM Bio-Imaging Forum

  10. Park Systems Unveils NX10: World’s Most Accurate AFM Nov 24, 2011

    Park Systems Unveils NX10: World’s Most Accurate AFM

  11. Park Systems: XE-HDM Nov 16, 2011

    Automatic Defect Review AFM for Hard Disk Media and Substrates

  12. Park Systems: XE-WAFER Nov 16, 2011

    Automated Industrial AFM for In-line Wafer Inspection and Metrology

  13. Park Systems: XE-PTR Nov 16, 2011

    Automated Industrial AFM for Metrology of Read/Write Heads

  14. For In-Line Pole Tip Recession Metrology of Hard Disk Sliders Oct 2, 2008

    XE-PTR

  15. Versatile, Research-Grade AFM with Motorized Optics Jun 9, 2008

    XE-100