Park Systems Jun 18, 2008
About this company
KANC 4F, Iui-Dong 906-10
Korea, Republic of
Park Systems is the Atomic Force Microscope(AFM) technology leader, providing products that address the requirements of all research and industrial nanoscale applications. All systems are fully compatible with innovative and powerful options.
The product line of Park Systems reflects our focused strength in nanometrology applications. The company's comprehensive portfolio of products, software, services, and expertise is designed and engineered to help customers achieve the metrology performance that meets the needs
and requirements of present and future applications.
In a nanoscale measurement, a repeatable, reproducible, and reliable measurement is just as important as nanoscale resolution. The innovative metrology platform of the XE-AFM ushered a new era of nanometrology that overcomes non-linearity and non-orthogonality associated with conventional piezoelectric tube based AFM. The XE-AFM is a disruptive market force that has far reaching consequences, in that it expands the application of nanometrology beyond what has been previously made possible with conventional AFM technology.
Products from this company
A revolutionary AFM design for bare wafer manufacturing that fully automates the automatic defect review process and increases production throughput by an astounding 1,000%.
Park Systems Collaborates with Leading Hard Disc Drive Manufacturers to Develop PTR Nanoscale Measurements that Increase Production Yields by 200 Percent.
An Astounding 1,000% Throughput Increase
Park Systems, a leader in Atomic Force Microscopy (AFM) since 1997 announces their first AFM image contest winner, Namuna Panday, a Graduate Student at Florida International University.
Park Systems New Atomic Force Microscope Technology Surpasses Old Standards for Semiconductor Failure Analysis Detection Ensuring Accuracy and Lowering Costs.
Park Systems Unveils New Park XE15 Jan 6, 2014
Powerfully Versatile Atomic Force Microscope with Unique MultiSample™ Scan.
Park Systems Introduces QuickStep SCM Dec 2, 2013
New High Speed Scanning Capacitance Microscopy
AFM Image Contest announced by Park Systems. Oct 4, 2013
Park Systems, a leader in AFM since 1997 announced today their first AFM image contest beginning Aug 26-Nov 1, 2013 for scientists, engineers, researchers and others who work with AFM.
Park Systems announced the PinPoint Counductive AFM, an extremely accurate conductive measurement technology at nano-scale resolution for failure analysis (FA) in the semiconductor industry.
Park Systems Introduces Park NX-HDM Jul 4, 2013
Fully Automated Automatic Defect Review and Sub-Angstrom Surface Roughness for Hard Disk Media and Semiconductor Substrates.
Park Systems: NX10 Dec 8, 2011
Park Systems: NX10
Park Systems: XE-70 Dec 8, 2011
Affordable Research-Grade AFM with Flexible Sample Handling
Park Systems: XE-100 Dec 8, 2011
Award-Winning Research-grade AFM with Step-and-Scan Automation
Park Systems: XE-120 Dec 8, 2011
Take the award-winning XE-100, shrink it such that it can be placed on top of the many popular inverted optical microscopes, and you have the versatile XE-120,
Park Systems: XE-150 Dec 8, 2011
Premier Cross-Functional AFM with Motorized Sample Stage
Park Systems: XE-Bio Dec 8, 2011
Non Contact In-liquid Imaging and Ion Conductance Microscopy
Park Systems: XE-NSOM Dec 8, 2011
Near-field Scanning Optical Microscopy built on Artifact-Free Imaging XE Platform
Park Systems: XE-3DM Dec 8, 2011
Automated Industrial AFM for High-Resolution 3D Metrology
Park Systems Japan to Sponsor AFM Bio-Imaging Forum Nov 24, 2011
Park Systems Japan to Sponsor AFM Bio-Imaging Forum
Park Systems Unveils NX10: World’s Most Accurate AFM Nov 24, 2011
Park Systems Unveils NX10: World’s Most Accurate AFM
Park Systems: XE-HDM Nov 16, 2011
Automatic Defect Review AFM for Hard Disk Media and Substrates
Park Systems: XE-WAFER Nov 16, 2011
Automated Industrial AFM for In-line Wafer Inspection and Metrology
Park Systems: XE-PTR Nov 16, 2011
Automated Industrial AFM for Metrology of Read/Write Heads