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Company details

Park Systems Jun 18, 2008

About this company

Park Systems
KANC 4F, Iui-Dong 906-10
Suwon
Korea
Korea, Republic of

Tel: +82-31-546-6800
Fax: +82-31-546-6805

Park Systems is the Atomic Force Microscope(AFM) technology leader, providing products that address the requirements of all research and industrial nanoscale applications. All systems are fully compatible with innovative and powerful options.

 

Products from this company

  1.   Professional AFM Images with a Three Step Click SmartScan by Park Systems Nov 25, 2014

    Revolutionizes Atomic Force Microscopy by Automatizing the Imaging Process

  2.   Park NX-Wafer fully automates the automatic defect review process for bare wafer Jul 15, 2014

    A revolutionary AFM design for bare wafer manufacturing that fully automates the automatic defect review process and increases production throughput by an astounding 1,000%.

  3. PTR Nanoscale Measurements that Increase Production Yields by 200 Percent May 29, 2014

    Park Systems Collaborates with Leading Hard Disc Drive Manufacturers to Develop PTR Nanoscale Measurements that Increase Production Yields by 200 Percent.

  4. Park Systems Introduces Automatic Defect Review for Semiconductor Wafers Apr 3, 2014

    An Astounding 1,000% Throughput Increase

  5.   Park Systems 2014 Announces Atomic Force Microscopy Image Contest Winner Mar 5, 2014

    Park Systems, a leader in Atomic Force Microscopy (AFM) since 1997 announces their first AFM image contest winner, Namuna Panday, a Graduate Student at Florida International University.

  6.   Park Systems New Atomic Force Microscope Technology Surpasses Old Standards Mar 5, 2014

    Park Systems New Atomic Force Microscope Technology Surpasses Old Standards for Semiconductor Failure Analysis Detection Ensuring Accuracy and Lowering Costs.

  7.   Park Systems Unveils New Park XE15 Jan 6, 2014

    Powerfully Versatile Atomic Force Microscope with Unique MultiSample™ Scan.

  8. Park Systems Introduces QuickStep SCM Dec 2, 2013

    New High Speed Scanning Capacitance Microscopy

  9. AFM Image Contest announced by Park Systems. Oct 4, 2013

    Park Systems, a leader in AFM since 1997 announced today their first AFM image contest beginning Aug 26-Nov 1, 2013 for scientists, engineers, researchers and others who work with AFM.

  10. Park Systems Announces PinPoint Conductive Atomic Force Microscopy (AFM) Oct 4, 2013

    Park Systems announced the PinPoint Counductive AFM, an extremely accurate conductive measurement technology at nano-scale resolution for failure analysis (FA) in the semiconductor industry.

  11. Park Systems Introduces Park NX-HDM Jul 4, 2013

    Fully Automated Automatic Defect Review and Sub-Angstrom Surface Roughness for Hard Disk Media and Semiconductor Substrates.

  12. Park Systems: NX10 Dec 8, 2011

    Park Systems: NX10

  13. Park Systems: XE-70 Dec 8, 2011

    Affordable Research-Grade AFM with Flexible Sample Handling

  14. Park Systems: XE-100 Dec 8, 2011

    Award-Winning Research-grade AFM with Step-and-Scan Automation

  15. Park Systems: XE-120 Dec 8, 2011

    Take the award-winning XE-100, shrink it such that it can be placed on top of the many popular inverted optical microscopes, and you have the versatile XE-120,

  16. Park Systems: XE-150 Dec 8, 2011

    Premier Cross-Functional AFM with Motorized Sample Stage

  17. Park Systems: XE-Bio Dec 8, 2011

    Non Contact In-liquid Imaging and Ion Conductance Microscopy

  18. Park Systems: XE-NSOM Dec 8, 2011

    Near-field Scanning Optical Microscopy built on Artifact-Free Imaging XE Platform

  19. Park Systems: XE-3DM Dec 8, 2011

    Automated Industrial AFM for High-Resolution 3D Metrology

  20. Park Systems Japan to Sponsor AFM Bio-Imaging Forum Nov 24, 2011

    Park Systems Japan to Sponsor AFM Bio-Imaging Forum

  21. Park Systems Unveils NX10: World’s Most Accurate AFM Nov 24, 2011

    Park Systems Unveils NX10: World’s Most Accurate AFM

  22. Park Systems: XE-HDM Nov 16, 2011

    Automatic Defect Review AFM for Hard Disk Media and Substrates

  23. Park Systems: XE-WAFER Nov 16, 2011

    Automated Industrial AFM for In-line Wafer Inspection and Metrology

  24. Park Systems: XE-PTR Nov 16, 2011

    Automated Industrial AFM for Metrology of Read/Write Heads

  25. For In-Line Pole Tip Recession Metrology of Hard Disk Sliders Oct 2, 2008

    XE-PTR

  26. Versatile, Research-Grade AFM with Motorized Optics Jun 9, 2008

    XE-100