This site uses cookies. By continuing to use this site you agree to our use of cookies. To find out more, see our Privacy and Cookies policy.
Skip to the content

IOP A community website from IOP Publishing

Company details

Henniker Scientific Ltd. Jan 23, 2013

About this company

Henniker Scientific Ltd.
Unit B3, Trident Business Park
Daten Avenue
Warrington
WA3 6AX
United Kingdom

Tel: +44 (0) 1925 830 771
Fax: +44 (0) 1925 800 035

Instruments (x-ray/UV/Ion/Electron Sources), components (Chambers/Manipulation/Transfer) & systems for Vacuum and UHV surface analysis (TPD/XPS/UPS/AES/ISS/STM/LEEM/PEEM/LEED/SIMS/SNMS & HREELS). Plasma surface treatment and process diagnostics.

 

Products from this company

  1. PGx, Portable Plasma Surface Testing Jun 10, 2013

    The all new PGx from Henniker is a Portable Contact Angle measurement instrument designed for rapid and accurate assessment of plasma treated materials.

  2. High Resolution Quadrupole Mass Spectrometer May 17, 2013

    The new Extrel MAXCS-50 Series quadrupole mass spectrometer from Henniker Scientific directly addresses research applications requiring high sensitivity gas analysis of low molecular weight species.

  3. New range of combination Deposition Systems for Materials Research Dec 13, 2012

    Henniker Scientific announce the release of a new range of multi-technique deposition systems for nano-materials research.

  4. Heat3-PS Dual Mode Sample Heater Supply for Surface Science Applications Nov 8, 2012

    The Heat3-PS Dual Mode Sample Heater Supply from Henniker is a compact, PID regulated power supply designed for accurate control of sample heating in a wide range of surface science experiments.

  5. MAX300 LG: Fast Transient Gas Analyser Aug 6, 2012

    Henniker introduce the MAX300 LG Fast Transient Gas Analyser System (FT-GAS) for rapid analysis of evolved gas processes.

  6. Extrel MAX-60, High Resolution Quadrupole Mass Spectrometers Jun 4, 2012

    Extrel MAX-60 Series quadrupole mass spectrometers from Henniker Scientific for precision mass analysis of low molecular weight species.

  7. TMC13 Deposition Rate Controller for Thin Film Applications May 3, 2012

    The TMC13 Deposition Rate Controller from Henniker Scientific is a versatile, multi-channel device designed for reliable control of film thickness and rate in thin film deposition processes.

  8. Impedans SEMION™ for pulsed plasma diagnostics Mar 6, 2012

    The Impedans Semion™ retarding field ion energy and flux analysers now feature an integrated time resolved operation mode for high time resolution studies of technological plasmas.

  9. Extrel MAX-HM Series, High Mass Quadrupole Mass Spectrometers Feb 14, 2012

    The Extrel MAX-HM Series quadrupole mass spectrometers from Henniker Scientific are now available with extended mass range options to 16,000 amu.

  10. MicroVision2 TPD Mass Spectrometer Jan 31, 2012

    Microvision2 is a TPD specific quadrupole mass spectrometer having the fastest, most accurate measurement characteristics over the entire dynamic measurement range.

  11. The Tetra Series low pressure plasma surface modification equipment Jan 10, 2012

    The Tetra Series plasma surface modification equipment from Henniker is now available with a range of chamber sizes suitable for both lab development and industrial scale plasma surface treatments.

  12. Extrel MAX-UF Series, Ultra-Fast Scanning Mass Spectrometers Dec 7, 2011

    The Extrel MAX-UF Series quadrupole mass spectrometers from Henniker Scientific now feature enhanced scanning mode delivering acquisition speeds in excess of 1000amu/sec.

  13. MAX300-LG MIMS: Membrane Inlet Mass Spectrometer May 12, 2011

    The MAX300-LG Membrane Inlet Mass Spectrometer (MIMS) for the analysis of both gases and dissolved gases in liquids.

  14. ES40C1 Scanning Electron Gun Mar 10, 2010

    The ES40C1 is a low cost focussed electron source for AES, EELS and electron pulse/desorption experiments.

  15. FS40A1 Electron Flood Gun Mar 10, 2010

    The FS 40A1 is a compact, easy to use and reliable electron flood gun source for charge neutralisation of insulators or semiconductors in XPS/AES and SIMS applications.

  16. Ion Flood Gun for Surface Preparation Mar 10, 2010

    The ion flood source IS 40C1 is a compact, easy-to-use UHV extractor type ion source for sample surface cleaning.

  17. IS40E1 Focussed Ion Gun for SIMS/XPS Mar 9, 2010

    The IS 40E1 scanning ion source is a two lens extractor type focussed ion gun for depth profiling in SIMS/XPS/ESCA applications.

  18. EBV 40A1 Electron Beam Evaporator Mar 9, 2010

    Compact single and multi-cell E-beam evaporator for thin film MBE growth applications.

  19. UVS40A2 Ultra-Violet Source for UPS Mar 9, 2010

    Low cost, high intensity UV source for ultraviolet photoelectron spectroscopy. Used & specified by many OEM manufacturers worldwide.

  20. RS40B1 twin anode X-Ray Source Mar 9, 2010

    The RS 40B1 UHV X-ray source is a new, high intensity twin anode Al/Mg UHV X-ray source optimised for XPS experiments.

  21. Custom Surface Preparation & Analysis Systems Mar 9, 2010

    Our custom, multi-technique UHV systems combine a wide range of thin film deposition/growth and UHV surface analysis techniques into a single, versatile system that doesn't cost the earth.