Conference on In-Situ and Correlative Electron Microscopy (CISCEM)

This conference aims to bring together an interdisciplinary group of scientists from the fields of biology, materials science, chemistry, and physics, to discuss future directions of electron microscopy research.

Topics will include nanoscale study of biological samples, and functional materials under realistic or near realistic conditions, for example, in gaseous environments, at elevated temperatures, and in liquid. It will be discussed how processes can be studied by including the time domain in electron microscopy, or by a combination of different microscopy methods, for example, correlative fluorescence microscopy and electron microscopy, or by using nanoparticle labels. CISCEM will be the opening ceremony for the facility for in-situ electron microscopy based around the newly installed JEOL ARM200 STEM/TEM at the INM.