LOT appointed as agents for the Ambios XP-Plus Series of Stylus Profilers May 8, 2008

Built on the success of the original XP profilers, the new XP-Plus Series Stylus Profilers are the result of five years of customer feedback and product innovation. The new XP-Plus systems provide the widest range of application specific capability. With a maximum 1.2 millimeter Z range, sub-angstrom height equivalent noise, 5 angstrom step height repeatability, optional 50nm encoded X-Y stages, 200mm long scan capability and many other features, the XP-Plus Series sets the new standard of excellence in the industry.

More products from this company

• Free Two Week Evaluation of the J A Woollam Alpha-SE™ Spectroscopic Ellipsometer Jan 22, 2010
• Trial period option on the Nuance Multispectral Imaging System Jan 22, 2010
• LOT offer a new range of standard monochromatic light source packages Jan 18, 2010
• NEW Quantum Design PPMS Scanning Probe Microscopy Inserts Dec 7, 2009
• NEW Abet "Class AAA" Sun 3000 Solar Simulators Dec 3, 2009
• NEW Hydra Probe Series – The world’s first truly hybrid probes Dec 3, 2009
• NEW LEJ Light Source for fluorescence excitation in Microscopy Nov 19, 2009
• A NEW comprehensive range of light source packages and accessories from LOT Nov 10, 2009
• NEW Oculus Single Channel Detectors Sep 24, 2009
• NEW Xi-100 Non-Contact Optical Profiler - Scanning White Light Interferometer Jun 16, 2009