LOT appointed as agents for the Ambios XP-Plus Series of Stylus Profilers May 8, 2008

Built on the success of the original XP profilers, the new XP-Plus Series Stylus Profilers are the result of five years of customer feedback and product innovation. The new XP-Plus systems provide the widest range of application specific capability. With a maximum 1.2 millimeter Z range, sub-angstrom height equivalent noise, 5 angstrom step height repeatability, optional 50nm encoded X-Y stages, 200mm long scan capability and many other features, the XP-Plus Series sets the new standard of excellence in the industry.

More products from this company

• LOT appointed UK & Ireland agents for the FEI Phenom imaging system Feb 27, 2008