LOT appointed as agents for the Ambios XP-Plus Series of Stylus Profilers May 8, 2008

Built on the success of the original XP profilers, the new XP-Plus Series Stylus Profilers are the result of five years of customer feedback and product innovation. The new XP-Plus systems provide the widest range of application specific capability. With a maximum 1.2 millimeter Z range, sub-angstrom height equivalent noise, 5 angstrom step height repeatability, optional 50nm encoded X-Y stages, 200mm long scan capability and many other features, the XP-Plus Series sets the new standard of excellence in the industry.

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• The NEW Park XE-7- Affordable, Research Grade AFM with Flexible Sample Handling Jun 10, 2013
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• NEW: Andor Technology iDus 416 CCD - Low Dark Current Deep-Depletion LDC-DD Jun 10, 2013
• The next generation of Stylus Surface Profilers Jan 17, 2013
• LOT-QuantumDesign appointed UK distributor of the JEOL NeoScope II benchtop SEM Jan 8, 2013
• Low cost Solar Simulator - now available for demonstration Jul 4, 2012
• LOT's New Online Product Guide 2012 Jul 4, 2012
• Rent a Thermal Imaging Camera from LOT May 15, 2012
• LOT Oriel UK teams up with Andor Technology Apr 3, 2012