The NEW AccuMap® SE from J A Woollam Dec 10, 2008

Characterizing thin film uniformity of large panels just got easier. The AccuMap-SE® combines a high-speed M-2000® spectroscopic ellipsometer with fast mapping for large areas. Gain confidence about your coatings that only accurate spectroscopic ellipsometry measurements can provide. The broad spectral range of the M-2000 is well suited to all thin films in photovoltaic and flat panel display applications.

Map uniformity of film thickness and optical constants for a wide range of coatings:

• Amorphous, Microcrystalline and Polycrystalline Silicon
• CIGS
• CdTe/CdS
• Transparent Conductive Oxides (ITO, SnO2:F, AZO...)

For more information please go to http://www.lot-oriel.com/site/site_down/woo_accumapse_uk01.pdf

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