The NEW Q-Scope White Light Interferometer/SPM from Ambios Technology Dec 10, 2008

How many SPM users wish they could just take a quick large area scan to characterize their sample surface? Q-View interferometer mode can take a 500 micron scan with nanometer resolution in a few seconds; switch to SPM mode and they can zoom in on the area of interest and image and measure in the sub-angstrom level. The interferometer mode and SPM mode both run off a new version of ScanAtomic software in real time and Q-Port Image rendering software, so the user can run two technologies on one instrument by switching from AFM Scan Head to Q-View Interferometer module.
Website Link: http://www.lot-oriel.com/site/pages_uk_en/products/profilers/profilers.php
Contact: Heath Young (e-mail heath@lotoriel.co.uk)

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