WITec Project Plus May 8, 2009

WITec, a manufacturer of high-resolution Optical and Scanning Probe Microscopy solutions, has introduced the WITec Project Plus software package for advanced data evaluation and chemometric image processing. It features various tools for multivariate data analysis in the fields of Confocal Raman Imaging and Scanning Probe Microscopy such as cluster analysis and principal component analysis. Thus, hidden structures in the images can be visualized automatically, leading to quick and consistent interpretation of the data. Additionally, a variety of advanced patent-pending analysis tools and algorithms enable comprehensive and userfriendly computerized data evaluation and image generation.

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