This site uses cookies. By continuing to use this site you agree to our use of cookies. To find out more, see our Privacy and Cookies policy.
Skip to the content

IOP A community website from IOP Publishing

Product details

NEW Xi-100 Non-Contact Optical Profiler - Scanning White Light Interferometer Jun 16, 2009

Company details

LOT-QuantumDesign Ltd
1 Mole Business Park
KT22 7BA
United Kingdom

Tel: 01372 378822
Fax: 01372 375353

The Xi-100 Non-Contact Optical Interferometer from Ambios Technology quickly and accurately measures the 3D topography of surfaces at the nanometer level.

It is designed for the researcher who is interested in getting fast, repeatable date from an instrument that is not encumbered by unneeded levels of complication.

Rapidly image areas in scale from microns to millimeters and the only instrument adjustments are sample position and focus.

Main features:

- Fast, non-destructive, 3-dimensional measurements
- Point and shoot operation
- High resolution, accuracy, and repeatability on smooth or rough surfaces
- Highly affordable

For more information please go to or contact Heath Young on 01372 378822, e-mail



More products from this company