CCHR High-resolution Carbon Nanotube Probes for Atomic Force Microscopy (AFM) Jun 18, 2009
Carbon Design Innovations, Inc. (C|D|I)
1745 Adrian Dr.
Fax: +1 650.648.0581
The CCHR high-resolution CNT AFM probes are designed for detailed imaging in metrology and materials science applications. The standard CNT probe length is 500 nm, with the exposed CNT tip <200 nm.
Carbon Design Innovations’ (C|D|I) carbon core high-resolution probes (CCHR) atomic force microscopy (AFM) start with a core carbon nanotube (CNT) that is then further processed and stabilized with patented technology resulting in a CNT probe with maximum resolution, imaging lifetime and stability.
Stabilized, robust CNT probe on a standard cantilever
High-resolution CNT tip with the convenience of a silicon cantilever
Longer lifetime allows users compare samples with the same probe with no loss of resolution
Reduced breakage, wear and contamination
Precise length, diameter and angle deliver consistent probe-to-probe results