NEW Quantum Design PPMS Scanning Probe Microscopy Inserts Dec 7, 2009

Due to its modular design and interchangeable microscopy head, the PPMS®-SPM can be operated in a variety of microscopic modes such as Atomic Force (AFM), Magnetic Force (MFM), and Confocal Microscopy (CFM).

The PPMS®-SPM is designed for plug-and-play compatibility with the popular PPMS® (Physical Property Measurement System) and provides access to a large variety of experimental conditions. Scans are possible even at cryogenic temperatures and with large magnetic fields.

· suitable for a temperature range from 2 K to 400 K
· suitable for magnetic fields up to 16 T
· easily interchangeable SPM head
· large cryogenic scan range (12 x 12 µm2)
· minimum drift in variable field/temperature
· high degree of automatization

More products from this company

• LOT launch the IBIS Nanoindentation Tester from Fischer Cripps in the UK Nov 14, 2011
• Summer Sale on all ILT Light Meters and Detectors 10% off until End August 2011 Jul 7, 2011
• Excitation Wavelength Selection with a Flick of the Thumb Jun 28, 2011
• Andover's Optical Filters – Prices have been greatly reduced on all filters Jun 21, 2011
• LOT Metrology Promotions on Stylus/Optical Surface Profilers and AFMs Jun 9, 2011
• LOT launch a new online Light Source Catalogue Jun 7, 2011
• A Low Cost Solar Simulator from Abet Technologies May 16, 2011
• WITec introduces “True Surface Microscopy” Topographic Confocal Raman Imaging Dec 13, 2010
• The New Nuance TRIO Multispectral Imaging System - Introductory price of £19,950 Dec 9, 2010
• The widest choice of Stylus and Optical Profiling tools available today Jun 24, 2010