The NEW J A Woollam T-Solar™ Ellipsometer Feb 24, 2010

The T-Solar™ ellipsometer combines the best photovoltaic measurement technology into a single system designed specifically for textured samples.

Based on the established
M-2000® rotating compensator spectroscopic ellipsometer, T-Solar measures hundreds of wavelength across the UV-Visible-NIR.

To improve performance on rough, textured surfaces that significantly reduce reflected signal, T-Solar combines a special High-Intensity Lamp source with our new Intensity-Optimizer*.

T-Solar is perfect for characterizing AR coatings on etched silicon surfaces. In addition, it features an adjustable tilt-rotation-stage*, which is required to align the pyramid structures of alkaline-etched monocrystalline surfaces.

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