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Sarfus 3D-IMM : New equipment for nanometric sample characterization in water Sep 14, 2010

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Parc des Sittelles
Montfort le Gesnois

Tel: +33 2 43 540 900

Nanolane is proud to announce the launch of its new equipment designed to match the needs of the research community, especially in the Life Science but also in Thin Film and Surface Treatment areas.

Like the other SARFUS products, SARFUS 3D-IMM is based on SEEC (Surface Enhanced Constrast Surface) optical technique that uses specific nonreflecting surfaces for cross-polarized reflected light microscopy. These surfaces -the Surfs- are used instead of standard microscope slides and generate a contrast enhancement of about 2 orders of magnitude, extending the application fields of optical microscopy toward the nanoworld.
Thanks to the absence of scanning and its easiness of use, SARFUS 3D-IMM equipment opens new perspectives for the nano-characterization in aqueous media by allowing dynamic studies of nanometric structures and rapid quality control of samples. In addition, the equipment is proposed with a 3D topographic software for complete characterization of nanometric samples.


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