SIMS Workstation, a UHV Surface Analysis System, for thin film depth profiling Jan 11, 2012

SIMS & SNMS analysis station:
-Rapid turnaround of all types of samples
-Static & dynamic SIMS
-Integral ioniser for SNMS & RGA
-Choice of Ion guns
-SNMS surface mapping/imaging
-Surface contamination analysis
-Flexible & upgradeable

Features:
-Hiden MAXIM SIMS analyser operating under MASsoft for ppb analysis
-Intergrated ioniser for efficient SNMS analysis
-Choice of differentially pumped Hiden IG20 Gas/IG-5C Caesium/IFG200 FAB/high performance liquid gallium guns as primary excitation source
-Integral ion gun raster control with signal gating for depth profiling
-Electron flood gun option for charge neutralisation in insulator studies
-Vacuum chamber bakeout heaters
-Fast sample transfer, sample holder & manipulator with load lock
-UHV manipulator
-SIMS elemental imaging option
-...

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