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Product details

Secondary ion mass spectrometer for UHV surface analysis & SNMS. The Hiden MAXIM Sep 28, 2010

Company details

Hiden Analytical Limited
420 Europa Boulevard
Warrington
Cheshire
WA5 7UN
United Kingdom

Tel: +44 (0)1925 445225
Fax: +44 (0)1925 416518

A state of the art secondary ion mass spectrometer for static and dynamic SIMS and SNMS applications.

MAXIM the most sensitive quadrupole SIMS analyser for the most sensitive elemental analysis technique.

Features:
-Mass range options:300amu/500amu/1000amu
-Detector:Ion counting detector, +ve & -ve ion detection, 107 cps
-Mass filter: Triple filter
-Pole diameter:9mm
-Bakeout:250°C
-Ion energy filter:30° angular acceptance
-Ioniser: Electron bombardment, single filament for SNMS & RGA

Applications:
-Integral energy filter for ion acceptance at 30° to probe axis
-High transmission SIMS extraction ion optics
-High efficiency electron impact SNMS ionizer
-Triple mass filter
-Pulse ion counting detector
-Control electronics with Windows MASsoft PC software
-Raster control for imaging & depth profiling

Visit our website for Specification's for the MAXIM Analyser (SIMS/SNMS).

 

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