Secondary ion mass spectrometer for UHV surface analysis & SNMS. The Hiden MAXIM Sep 28, 2010

MAXIM the most sensitive quadrupole SIMS analyser for the most sensitive elemental analysis technique.

Features:
-Mass range options:300amu/500amu/1000amu
-Detector:Ion counting detector, +ve & -ve ion detection, 107 cps
-Mass filter: Triple filter
-Pole diameter:9mm
-Bakeout:250°C
-Ion energy filter:30° angular acceptance
-Ioniser: Electron bombardment, single filament for SNMS & RGA

Applications:
-Integral energy filter for ion acceptance at 30° to probe axis
-High transmission SIMS extraction ion optics
-High efficiency electron impact SNMS ionizer
-Triple mass filter
-Pulse ion counting detector
-Control electronics with Windows MASsoft PC software
-Raster control for imaging & depth profiling

Visit our website for Specification's for the MAXIM Analyser (SIMS/SNMS).

More products from this company

• SIMS Workstation, a UHV Surface Analysis System, for thin film depth profiling Jan 11, 2012
• TPD Workstation for UHV Thermal Desorption Studies Jan 11, 2012
• XBS Triple Filter Mass Spectrometer Jan 11, 2012
• Atmospheric Gas Analysis System - QGA Feb 23, 2011
• Hiden Ion Milling Probe – End Point Detector Sep 28, 2010
• Residual Gas Analysers for Vacuum Diagnostics and Leak Detection Sep 28, 2010
• ESPion, an Advanced Langmuir Probe for Plasma Diagnostics Sep 28, 2010
• Multi Stream Gas/Vapour Analyser - QIC Biostream Sep 28, 2010
• Hiden HPR-20 QIC Real time gas analyser for multi-species gas & vapour analysis Sep 28, 2010
• EQS, a Secondary Ion Mass Spectrometer bolt on SIMS Analyser Sep 28, 2010