WITec introduces “True Surface Microscopy” Topographic Confocal Raman Imaging Dec 13, 2010

WITec, worldwide leader in nano-analytical microscopy systems, has launched the new True Surface Microscopy option. The core element of this revolutionary imaging mode is an integrated sensor for optical profilometry.

Large-area topographic coordinates from the profilometer measurement can be precisely correlated with the large-area confocal Raman imaging data. This allows for the first time confocal Raman imaging along heavily inclined or very rough samples with the true surface held in constant focus while maintaining the highest confocality. With the new imaging mode, samples that had previously required extensive preparation in order to obtain a certain surface flatness can now be effortlessly and automatically characterized as they are.

More products from this company

• The next generation of Stylus Surface Profilers Jan 17, 2013
• LOT-QuantumDesign appointed UK distributor of the JEOL NeoScope II benchtop SEM Jan 8, 2013
• Low cost Solar Simulator - now available for demonstration Jul 4, 2012
• LOT's New Online Product Guide 2012 Jul 4, 2012
• Rent a Thermal Imaging Camera from LOT May 15, 2012
• LOT Oriel UK teams up with Andor Technology Apr 3, 2012
• LOT launch the IBIS Nanoindentation Tester from Fischer Cripps in the UK Nov 14, 2011
• Summer Sale on all ILT Light Meters and Detectors 10% off until End August 2011 Jul 7, 2011
• Excitation Wavelength Selection with a Flick of the Thumb Jun 28, 2011
• Andover's Optical Filters – Prices have been greatly reduced on all filters Jun 21, 2011