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AFM Scanner Catalog: Planar Piezo Stages for Atomic Force Microscopes, SPM Mar 29, 2011

Piezo nanopositioning stage specialist PI has released a new catalog on planar piezo scanners for Atomic Force Microscopy and Scanning Probe Microscopes.

The new catalog covers a variety of novel closed-loop planar piezo scanners & digital controllers with advanced features for higher scanning frequency, improved linearity & responsiveness.

Compared to conventional piezo tube scanners, the low-bow, flexure-guided, closed-loop piezo stages provide significantly lower out-of-plane motion (flatness) and better linearity. A special stage designed with a new lead-free piezo material allows resolution down to 20 picometers and less than 1 nanometer hysteresis.

Flexure stages to 1.8 mm travel are available.

Self-locking ultrasonic-motor stages to 200mm travel are recommended as a stable base for the high-speed piezo scanners.

Piezo Scanner AFM Catalog PDF

 

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