DME DualScope 95 AFM Mar 29, 2011
DME Nanotechnologie GmbH
Am Listholze 82
+49 700 1811 0700
The most flexible, high performance, high throughput AFM probe scanner available on the marked
The DME DualScope AFM scanners combine the best of different areas: The compact probe scanners provide optimal performance, highest stability and are at the same time the most easy-to-use AFM scanners on the marked. Changing a cantilever only takes seconds. The scanners belong to the most sensitive sytems on the marked and support working with oscillation amplitudes downto 1 nm, the optimal choice for advanced measurements like KFPM or MFM. The scanners provide an optical axis for always observing the tip at work. They operate in any orientation and any stage. The integrated low-mass scan unit provides highest scan speeds at optimal results. Just relax, the integrated tip-guard takes care of your cantilever, independent of how fast you scan. See the DME website for stage and other options.
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