Bruker Announces Dimension FastScan, the World's Fastest High-Resolution AFM Jul 19, 2011
Bruker Nano Surfaces
112 Robin Hill Road
New Gold Standard in AFM Technology Provides Fastest Scanning at High Resolution and Amazingly Short Time to Data in One System for Radically Increased Productivity.
Santa Barbara, CA- Bruker today announced the innovative and unique Dimension FastScan™ Atomic Force Microscope (AFM), which delivers a significant breakthrough in improved imaging speed without sacrificing nanoscale resolution. The Dimension FastScan enables users to work hundreds of times faster than is possible with other commercial AFM systems, delivering results in seconds or minutes instead of hours or days. The FastScan system sets the new gold standard for performance and productivity in large-sample, atomic scale imaging across the scientific, biological, semiconductor, data storage and energy research markets.