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Xenemetrix EDXRF Spectrometer for Laboratories Jun 23, 2011

Available from Eastern Applied Research, the Xenemetrix EX-6600 series of XRF Analyzers provides optimum performance with secondary targets and silicon drift detection systems.

Xenemetrix's EX-6600 SDD Energy Dispersive X-ray Fluorescence (EDXRF) spectrometer offers the ultimate in sensitivity and selectivity. The Silicon Drift Detector (SDD) simultaneously delivers lower electronic noise and higher count rates which translates to higher energy resolution and fast results compared to a Si-PIN detection system. Eight secondary targets provide maximum sensitivity for fast and precise quantification even in difficult matrices such as alloy, plastic and geological samples. Targets are fully customizable to achieve sub-ppm detection limits. The versatile EX-6600 SDD can analyze liquids, solids, slurries, powders, pellets and air filters and the analytical chamber accomodates samples of different shapes and sizes. Systems are available with multi-sample stages.

 

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