This site uses cookies. By continuing to use this site you agree to our use of cookies. To find out more, see our Privacy and Cookies policy.
Skip to the content

IOP A community website from IOP Publishing

Key supplier

Product details

Nano-Indentation / Materials Testing w/ Scanning Probe Microscopy / Piezo Stages Jul 6, 2011

A flexible nano-indentation system by Micro Materials Ltd. offers a variety of methods for materials characterization, including nano-indentation, nano-impact and nano-scratch and wear measurements.

The system can measure penetration depths between 0.1 nanometers and 50 microns based on a PISeca capacitive gage by PI. A combined indentation / scanning probe microscope mode based on a piezo scanning stage provides a quick method for assessing the sample surface.

Read Nano-Indenter Technote:

For more information on the NanoTest system visit http://www.micromaterials.co.uk.
For more information on piezo nano-positioning systems http://www.nanopositioning.net