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Bruker Announces Fast Scanning for the MultiMode Atomic Force Microscope Jul 19, 2011

Company details

Bruker Nano Surfaces
112 Robin Hill Road
Santa Barbara
CA
93117
United States

Tel: 805-967-2700
Fax: 805-967-7717

The system’s new ScanAsyst-HR feature provides a direct 6× increase in imaging rate for significantly improved research productivity.

SANTA BARBARA, CA,– Bruker today announced new fast scanning capabilities for the MultiMode® 8 Atomic Force Microscope (AFM). The system’s new ScanAsyst-HR feature provides a direct 6× increase in imaging rate for significantly improved research productivity. This remarkable development leverages Bruker’s exclusive ScanAsyst® Imaging Mode, which has established itself as the industry standard for AFM ease of use.

 

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