Product details
Park Systems: XE-NSOM Dec 8, 2011
Company details
Park Systems
KANC 4F, Iui-Dong 906-10
Suwon
Korea
Korea, Republic of
Tel:
+82-31-546-6800
Fax:
+82-31-546-6805
Near-field Scanning Optical Microscopy built on Artifact-Free Imaging XE Platform
Built on the award-winning XE-100 AFM platform, the XE-NSOM is designed to provide the most stable measurement conditions for both topography and NSOM measurements. Its dedicated optical modules, allowing access to the top, side, and bottom of the sample, facilitate a variety of NSOM configurations including transmission and reflection mode. With the precise feedback control of the XE AFM platform, the XE-NSOM sets a new standard for accurate observation of near-field optical phenomena.
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