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Product details

Park Systems: XE-NSOM Dec 8, 2011

Company details

Park Systems
KANC 4F, Iui-Dong 906-10
Suwon
Korea
Korea, Republic of

Tel: +82-31-546-6800
Fax: +82-31-546-6805

Near-field Scanning Optical Microscopy built on Artifact-Free Imaging XE Platform

Built on the award-winning XE-100 AFM platform, the XE-NSOM is designed to provide the most stable measurement conditions for both topography and NSOM measurements. Its dedicated optical modules, allowing access to the top, side, and bottom of the sample, facilitate a variety of NSOM configurations including transmission and reflection mode. With the precise feedback control of the XE AFM platform, the XE-NSOM sets a new standard for accurate observation of near-field optical phenomena.

 

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