MPS-C-300 Magnetic Probe Station Dec 12, 2011
295 Industrial Drive
The MPS-C-300 magnetic probe station is the world’s first probe station capable of immersing a sample in a fully controllable three dimensional magnetic field.
The MPS-C-300 magnetic probe station is the world’s first probe station capable of immersing a sample in a fully controllable three dimensional magnetic field. MicroXact’s design enables wafer-level testing of spintronic devices, nanoscale electronics and many other materials and devices where magnetic fields are required for accurate testing and measurements. With arbitrary user-defined orientation and profile of the applied magnetic field our probe stations provide unmatched throughput and characterization capabilities for spintronic and magneto-electronic devices and circuits. Wafer-size testing capabilities, combined with convenient and easy-to-use sample handling and micromanipulator positioning, enable accurate and thorough testing for both R&D and production environments.
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