This site uses cookies. By continuing to use this site you agree to our use of cookies. To find out more, see our Privacy and Cookies policy.
Skip to the content

IOP A community website from IOP Publishing

Product details

The webinar “TERS. Approaching 10 nm spatial resolution in Raman imaging” Mar 13, 2012

Company details

NT-MDT
NT-MDT Co.
Building 2, room 431, Technopark, South Industrial Zone, passage 4922,
Zelenograd, Moscow
Russian Federation

Tel: +7 (499) 735-7777
Fax: +7 (499) 735-6410

NT-MDT invites everyone to the webinar “Tip-Enhanced Raman Scattering. Approaching 10 nm spatial resolution in Raman imaging” that will take place on March 20-21.

NT-MDT is happy to invite to the webinar “Tip-Enhanced Raman Scattering. Approaching 10 nm spatial resolution in Raman imaging” by Dr. Pavel Dorozhkin.

Tip-Enhanced Raman Scattering (TERS) is the technique utilizing a special AFM probe (nano-antenna) to localize light at the nanometer scale area near the probe apex. When scanning the sample with respect to the probe, the obtained optical (Raman or fluorescence) maps have lateral resolution which is not limited by the light diffraction. A deep integration of AFM with confocal Raman microscopy is required for successful TERS experiment.

 

More products from this company