This site uses cookies. By continuing to use this site you agree to our use of cookies. To find out more, see our Privacy and Cookies policy.
Skip to the content

IOP A community website from IOP Publishing

Product details

Sarfus Mapping Lite Apr 3, 2012

Company details

NANOLANE
Parc des Sittelles
Montfort le Gesnois
France

Tel: +33 2 43 540 900

Sarfus Mapping Lite turns a conventional optical microscope into a nanoscale measuring device

Nanolane (www.nano-lane.com), specialised in the development and commercialisation of nanomaterials characterisation systems, is bringing out an innovative measurement solution –Sarfus Mapping Lite– that fits in with any optical microscope setup functioning with reflected light. This product is for imaging nanometric objects such as nanotubes, nanowires, DNA strands, nanoparticles but most of all it allows for the measurement of thin films as well as surface treatment of nanometric thickness.
Applications are many: thin film characterisation (organics, inorganics, liquid crystals, lithography to name but a few), biological systems (biochips, biofilms, etc.) as well as many others, more fundamental research-related for instance: nanopatterns, Langmuir-Blodgett layers, SAMs and so forth.

 

More products from this company