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Product details

Combined AFM SEM FIB Jun 25, 2012

Company details

Nanonics Imaging, Ltd.
Har Hotzvim Hi Tech Park
19 Hartum Street, BYNET Bldg.

Tel: +972-2-678-9573
Fax: +972-2-648-0827

The combination of Focused Ion Beam (FIB) and Scanning Electron Microscopy (SEM) is a moving force in the nanotechnology revolution.

Nanonics Imaging offers seamless integration of SEM and FIB in a Scanning Probe Microscope (SPM) without effecting any detectors, injectors or analyzers, and without obscuring the sample stage or axis of the twin beam systems. The unique, transparent integration allows the SPM to rotate into position with either the electron or ion beam in place. This Triple BeamTM combination is a disruptive technology, revolutionizing the potential of electron, ion and scanning probe applications.


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