This site uses cookies. By continuing to use this site you agree to our use of cookies. To find out more, see our Privacy and Cookies policy.
Skip to the content

IOP A community website from IOP Publishing

Product details

Park Systems Announces PinPoint Conductive Atomic Force Microscopy (AFM) Oct 4, 2013

Company details

Park Systems
KANC 4F, Iui-Dong 906-10
Korea, Republic of

Tel: +82-31-546-6800
Fax: +82-31-546-6805

Park Systems announced the PinPoint Counductive AFM, an extremely accurate conductive measurement technology at nano-scale resolution for failure analysis (FA) in the semiconductor industry.

"PinPoint Conductive AFM is designed to integrate with Park Systems NX20 Atomic Force Microscope
and other Park AFM Products. PinPoint Conductive technology has succeeded in solving all of the shortcomings
of conventional conductivity AFM such as quick tip wear, degradation of resolution, low signal to noise ratio,
no tip pressure control, and poor reproducibility of data"


More products from this company