Sarfus Mapping Stations from Nanolane Nov 22, 2013
Parc des Sittelles
Montfort le Gesnois
+33 2 43 540 900
Nanolane offers its new generation of Sarfus Mapping stations, label-free analytical instruments for real-time sample characterization at nanoscale (down to 0.1nm or 1ng/cm²).
Based on the unique SEEC (Surface Enhanced Ellipsometric Constrast) microscopy, this new generation of tools not only tracks changes at surface but also offers live visualization with high lateral resolution and thickness measurements (from 0.1 to 300nm). This provides new information for understanding surface phenomena such as molecular interactions, layer morphological changes, biofilms build-up… Thanks to its easiness of use, only few seconds are required to get a complete characterization of your samples.
More products from this company
- Sarfus Mapping Lite Apr 3, 2012
- Sarfus 3D-IMM : New equipment for nanometric sample characterization in water Sep 14, 2010