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Product details

Park Systems NX20 Atomic Force Microscope Dec 11, 2013

Company details

LOT-QuantumDesign Ltd
1 Mole Business Park
KT22 7BA
United Kingdom

Tel: 01372 378822
Fax: 01372 375353

- the world’s most accurate large sample AFM (200mm sample stage)

Accurate AFM Solutions for FA and Research Laboratories
• Surface roughness measurements for media and substrates

Accurate and Reproducible Measurements for Better Productivity
• Non-contact mode to preserve tip sharpness for surface roughness accuracy

Accurate AFM Topography with Low Noise Z Detector
• Sample topography measured by industry leading low noise Z detector

Cost Savings with True Non-ContactTM Mode
• 10 times or longer tip life during general purpose and defect imaging

For more information please contact Heath Young on 01372 378822, email


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