Park Systems Unveils New Park XE15 Jan 6, 2014
KANC 4F, Iui-Dong 906-10
Korea, Republic of
Powerfully Versatile Atomic Force Microscope with Unique MultiSample™ Scan.Request info
Park Systems, a leading manufacturer of atomic force microscopy (AFM) products, announces the debut of Park XE15, a powerfully versatile atomic force microscope featuring a unique MultiSample™ scan. This newly developed large sample AFM provides researchers and operators with the ability to automatically image and measure up to nine individual samples.
Park Systems, a leading manufacturer of atomic force microscopy (AFM) products, announces the debut of Park XE15, a powerfully versatile atomic force microscope featuring a unique MultiSample™ scan. This newly developed large sample AFM provides researchers and operators with the ability to automatically image and measure up to nine individual samples. Park XE15 can also easily scan larger samples of up to 200 mm x 200 mm, a vast improvement from the current AFM products on the market. Park XE15 is ideally suited for shared labs environments that handle a diverse range of samples, researchers doing multi variant experiments, and failure analysis engineers working on wafers.
"We continue to set new standards of excellence with our new technology and high accuracy in AFM imaging and measurements," says Dr. Sang-Il Park, the founder and CEO of Park Systems. "Park XE15 features our most inclusive set of scan modes and can process a range of sample sizes, designed specifically to provide ease of use for shared labs with a wide range of individual requirements."
Park XE15 is the only AFM that maximizes the efficiency of product use with MultiSample™ scan, automated imaging of multiple samples in one pass. Specially designed multi-sample chuck holds up to nine individual samples which allows operators to scan the samples under identical environmental conditions, improving the accuracy and reliability of the data. After loading the stage with multiple samples, the scan process can be initiated. This makes it ideal for researchers wanting to scan larger samples or failure analysis engineers who need to place silicon wafers on the stage.
"Over the many years that I have worked with Park System, I have found them very responsive to customer feedback in developing new products. Park XE 15 is a problem-solver for engineers who need to process multiple samples simultaneously in a controlled environment," comments Ahmed A. Busnaina, Professor and Director The NSF Nanoscale Science and Engineering Center for High-rate Nanomanufacturing (NSEC) and the NSF Center for Microcontamination Control, Northeastern University. "The Park engineering team is a great nanoscale partner, working in unison with customers to create products that meet customer performance requirements."
About Park Systems
Park Systems is a world-leading manufacturer of atomic force microscopy (AFM) systems with a complete range of products for researchers and industry engineers in chemistry, materials, physics, life sciences, semiconductor and data storage industries. Park’s products are used by over a thousand institutions and corporations worldwide. Park’s AFM provides highest data accuracy at nanoscale resolution, superior productivity, and lowest operating cost thanks to its unique technology and innovative engineering. Park Systems, Inc. is headquartered in Santa Clara, California with its global manufacturing, and R&D headquarters in Korea. Park’s products are sold and supported worldwide with regional headquarters in the US, Korea, Japan, and Singapore, and distribution partners throughout Europe, Asia, and America. Call 408-986-1110 for more information.
More products from this company
- Park NX-Wafer fully automates the automatic defect review process for bare wafer Jul 15, 2014
- PTR Nanoscale Measurements that Increase Production Yields by 200 Percent May 29, 2014
- Park Systems Introduces Automatic Defect Review for Semiconductor Wafers Apr 3, 2014
- Park Systems 2014 Announces Atomic Force Microscopy Image Contest Winner Mar 5, 2014
- Park Systems New Atomic Force Microscope Technology Surpasses Old Standards Mar 5, 2014
- Park Systems Introduces QuickStep SCM Dec 2, 2013
- AFM Image Contest announced by Park Systems. Oct 4, 2013
- Park Systems Announces PinPoint Conductive Atomic Force Microscopy (AFM) Oct 4, 2013
- Park Systems Introduces Park NX-HDM Jul 4, 2013