Park Systems Unveils New Park XE15 Jan 6, 2014
KANC 4F, Iui-Dong 906-10
Korea, Republic of
Powerfully Versatile Atomic Force Microscope with Unique MultiSample™ Scan.
Park Systems, a leading manufacturer of atomic force microscopy (AFM) products, announces the debut of Park XE15, a powerfully versatile atomic force microscope featuring a unique MultiSample™ scan. This newly developed large sample AFM provides researchers and operators with the ability to automatically image and measure up to nine individual samples.
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