Park Systems New Atomic Force Microscope Technology Surpasses Old Standards Mar 5, 2014
KANC 4F, Iui-Dong 906-10
Korea, Republic of
Park Systems New Atomic Force Microscope Technology Surpasses Old Standards for Semiconductor Failure Analysis Detection Ensuring Accuracy and Lowering Costs.
Park Systems, a leading manufacturer of Atomic Force Microscopy systems since 1997 announced PinPoint Conductive AFM, an extremely accurate conductive measurement technology at nano-scale resolution for failure analysis (FA) in the semiconductor industry.
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