Dimension FastScanTM Atomic Force Microscope Mar 6, 2014
Bruker Nano Surfaces
112 Robin Hill Road
The Dimension FastScanTM Atomic Force Microscope (AFM) delivers, for the first time, extreme imaging speed without sacrificing legendary Dimension© Icon© resolution and performance.
This breakthrough innovation enables radically faster time to publishable data for all levels of AFM expertise. Stimulated by AFM users’ need for greater AFM efficiency, Bruker set out to develop a system that could scan fast without loss of resolution, loss of force control, added complexity, or additional operating costs. Now, with the Dimension FastScan system you achieve immediate AFM images with the expected high resolution of a high-performance AFM, all in one system.
Whether you scan at >125Hz when surveying a sample to find the region of interest, or at time rates of 1-second per image frame in air or fluid, FastScan redefines the AFM experience.